Description
This paper introduces a proof-of-concept low-noise CMOS image sensor (CIS) intended for photon-starved imaging applications. The proposed architecture is based on a charge-sampling pixel featuring in-pixel amplification to reduce its inputreferred noise. With the proposed technique, the structure realizes a period-controlled variable conversion factor at pixel-level. This enables the conversion factor and the noise-equivalent number of electrons to be tunable according to the application without any change in hardware. The obtained noiseperformance is comparable to the state-of-the-art lownoise CIS, while this work employs a simpler circuit, without suffering from dynamic range limitations. The
device is fabricated in a low-cost, standard CIS process.
| Period | 30 May 2017 → 2 Jun 2017 |
|---|---|
| Event title | International Image Sensor Workshop 2017 |
| Event type | Conference |
| Location | Hiroshima, JapanShow on map |