In-situ monitoring of the Atomic Force Microscopy (AFM) tip by analysing the cantilever’s higher harmonic vibrations

Rull Trinidad, E. (Speaker), Staufer, U. (Speaker)

Activity: Talk or presentationTalk or presentation at a conference

Description

Presentation at the International MicroNano Conference 2015, Amsterdam, The Netherlands
Period8 Dec 2015
Event titleInternational MicroNano Conference
Event typeConference
LocationAmsterdam, Netherlands