Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS.

The data concerns cryogenic low-frequency noise characterization of CMOS transistors. A wide range of geometries and bias points are swept. Details on how the data was recorded are found in the associated paper and its supplementary. For using the data, please refer to the "README.txt" file that is part of the data.