Description
Raw microscopy data underlying the publication, structured per experiment (figure). The imaging setting that is varied in the experiments (exposure/dwell time, beam current, landing energy) is indicated by the folder or image name. The images may have a data bar indicating the relevant acquisition settings.
For more information on the sample preparation and image acquisition, see the Methodology section in the publication.
The code and data analysis notebooks are included in the accompanying Github repository: https://github.com/hoogenboom-group/Kievits-OSTEM-2023
For more information on the sample preparation and image acquisition, see the Methodology section in the publication.
The code and data analysis notebooks are included in the accompanying Github repository: https://github.com/hoogenboom-group/Kievits-OSTEM-2023
| Date made available | 16 Oct 2023 |
|---|---|
| Publisher | TU Delft - 4TU.ResearchData |
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Volume Electron Microscopy with 64 Beams and Optical Transmission Detection
Kievits, A. J., 2025, 126 p.Research output: Thesis › Dissertation (TU Delft)
Open AccessFile18 Downloads (Pure) -
Optical STEM detection for scanning electron microscopy
Kievits, A. J., Duinkerken, B. H. P., Fermie, J., Lane, R., Giepmans, B. N. G. & Hoogenboom, J. P., 2024, In: Ultramicroscopy. 256, 10 p., 113877.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile8 Link opens in a new tab Citations (Scopus)143 Downloads (Pure)
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