Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices

Dataset

Description

This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time.
Date made available17 Sept 2021
PublisherTU Delft - 4TU.ResearchData
Date of data production2021

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