Research output per year
Research output per year
Research output
Search results
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2024
Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling
Skoupý, R., Jakobi, A., Boltje, D. B. & Hoogenboom, J. P., 2024, IPC No. H01J, G01N, Priority date 29 Jul 2022, Priority No. NL2032641Research output: Patent
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Method for localizing a region of interest in a sample and micromachining the sample using a charged particle beam
van der Wee, E. B., Boltje, D. B. & Hoogenboom, J. P., 2024, IPC No. G02B, G01N, Priority date 29 Jul 2022, Priority No. NL2032640Research output: Patent