ImPhys/Hoogenboom group

14 Article
10 Dissertation (TU Delft)
4 Conference contribution
3 Patent
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- 1 Book
- 1 Preprint

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2024

Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling
Skoupý, R., Jakobi, A., Boltje, D. B. & Hoogenboom, J. P., 2024, IPC No. H01J, G01N, Priority date 29 Jul 2022, Priority No. NL2032641
Research output: Patent
Method for localizing a region of interest in a sample and micromachining the sample using a charged particle beam
van der Wee, E. B., Boltje, D. B. & Hoogenboom, J. P., 2024, IPC No. G02B, G01N, Priority date 29 Jul 2022, Priority No. NL2032640
Research output: Patent
2023

Integrated optical and charged particle inspection apparatus
Hoogenboom, J. P. & den Hoedt, S., 2023, IPC No. H01J, Patent No. US 11742173 B2, Priority date 24 Sept 2020
Research output: Patent