ImPhys/Microscopy Instrumentation & Techniques

Research output

Research output per year 1988 1996 1997 1998 1999 2000 2001 2002 2008 2009 2019 2023

• 350 Article
• 142 Conference contribution
• 118 Patent
• 110 Report
• 102 More
  • 40 Dissertation (TU Delft)
  • 22 Chapter
  • 12 Abstract
  • 8 Conference article
  • 5 Review article
  • 4 Book
  • 3 Editorial
  • 2 Dissertation (external)
  • 1 Book editing
  • 1 Entry for encyclopedia/dictionary
  • 1 Poster
  • 1 Comment/Letter to the editor
  • 1 Letter
  • 1 Dissertation (external, preparation TU Delft)

Research output per year

Research output per year

Search results

• 2022

  Anisoplanatic Aberration Control in Multiphoton Holographic Projections

  Maddalena, L., Keizers, H., Pozzi, P. & Carroll, E., 2022, Digital Holography and Three-Dimensional Imaging, DH 2022. Optica Publishing Group (formerly OSA), W1A.4. (Optics InfoBase Conference Papers).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • control 100%
  • holography 100%
  • Holograms 100%
  • Adaptive Optics 100%
  • Sensor 50%
• 2021

  Genetic Algorithm Performance and the Influence of its Control Parameters on the Optimization of Optical Lens Design

  Hesam Mahmoudi Nezhad, N. & Ghaffarian Niasar, M., 2021, 2021 IEEE Congress on Evolutionary Computation, CEC 2021 - Proceedings. IEEE, p. 65-70 9504778. (2021 IEEE Congress on Evolutionary Computation, CEC 2021 - Proceedings).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • control 100%
  • design 100%
  • lenses 100%
  • optimization 100%
  • genetic algorithms 100%
• 2020

  Local versus Global Optimization of Electron Lens System Design

  Nezhad, N. H. M., Niasar, M. G., Hagen, C. W. & Kruit, P., 2020, 6th International Conference on Optimization and Applications, ICOA 2020 - Proceedings. Hachimi, H., Kaicer, M., Addaim, A. & Melliani, S. (eds.). Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 9094475

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access

  File

  • electrons 100%
  • design 100%
  • lenses 100%
  • optimization 100%
  • Optimization 100%
  4 Citations (Scopus)

  56 Downloads (Pure)

• Understanding the influence of 3D sidewall roughness on observed line-edge roughness in scanning electron microscopy images

  Van Kessel, L., Huisman, T. & Hagen, C. W., 2020, Proceedings of SPIE: Metrology, Inspection, and Process Control for Microlithography XXXIV. Adan, O. & Robinson, J. C. (eds.). SPIE, Vol. 11325. 17 p. 113250Z. (METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access

  File

  • Edge Roughness 100%
  • Images 100%
  • Sidewall Roughness 100%
  • Image 100%
  • Scanning Electron Microscopy 100%
  1 Citation (Scopus)

  117 Downloads (Pure)
• 2019

  Surface effects in simulations of scanning electron microscopy images

  Van Kessel, L., Hagen, C. W. & Kruit, P., 2019, Proceedings of SPIE: Metrology, Inspection, and Process Control for Microlithography XXXIII. Ukraintsev, V. A. & Adan, O. (eds.). SPIE, Vol. 10959. 16 p. 109590V. (Metrology, Inspection, and Process Control for Microlitography XXXIII).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access

  File

  • surfaces 100%
  • scanning electron microscopy 100%
  • simulation 100%
  • images 100%
  • Image 100%
  1 Citation (Scopus)

  78 Downloads (Pure)
• 2018

  Model improvements to simulate charging in SEM

  Arat, K. T., Klimpel, T. & Hagen, C. W., 1 Jan 2018, Metrology, Inspection, and Process Control for Microlithography XXXII. Ukraintsev, V. A. & Adan, O. (eds.). SPIE, Vol. 10585. 1058518

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access

  File

  • Scanning Electron Microscopy 100%
  • Improvement 100%
  • Model 100%
  • Electric Field 40%
  • Electric Fields 40%
  1 Citation (Scopus)

  67 Downloads (Pure)
• 2017

  Challenges for scanning electron microscopy and inspection on the nanometer scale for non-IC application: And how to tackle them using computational techniques

  Bolten, J., Arat, K. T., Ünal, N., Porschatis, C., Wahlbrink, T. & Lemme, M. C., 2017, 33rd European Mask and Lithography Conference. SPIE, Vol. 10446. 7 p. 104460G

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access

  File

  • applications 100%
  • scanning electron microscopy 100%
  • inspection 100%
  • Nanometre 100%
  • Computational Technique 100%
  1 Citation (Scopus)

  209 Downloads (Pure)
• 2016

  GPU accelerated Monte-Carlo simulation of SEM images for metrology

  Verduin, T., Lokhorst, S. R. & Hagen, C. W., 2016, Proceedings of SPIE: Metrology, Inspection, and Process Control for Microlithography XXX. Sanchez, M. I. & Ukraintsev, V. A. (eds.). SPIE, Vol. 9778. 15 p. 97780D

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • units 100%
  • scanning electron microscopy 100%
  • metrology 100%
  • simulation 100%
  • processing 100%
  9 Citations (Scopus)

• MBSEM image acquisition and image processing in LabView FPGA

  Rahangdale, S., Keijzer, P. & Kruit, P., 2016, IWSSIP 2016 - Proceedings of the 23rd International Conference on Systems, Signals and Image Processing. Rybarova, R., Rozinaj, G., I., M. & P., T. (eds.). IEEE, Vol. 2016-June. 4 p. 7502728

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • scanning electron microscopy 100%
  • images 100%
  • image processing 100%
  • beams 100%
  • Field Programmable Gate Arrays 100%
  4 Citations (Scopus)

• Simulation of shotnoise induced side-wall roughness in electron lithography

  Verduin, T., Lokhorst, S. R., Hagen, C. W. & Kruit, P., 2016, Metrology, Inspection, and Process Control for Microlithography XXX. Sanchez, M. I. & Ukraintsev, V. A. (eds.). SPIE, Vol. 9778. 97781Z. (Proceedings of SPIE; vol. 9778).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access

  File

  • electrons 100%
  • roughness 100%
  • simulation 100%
  • walls 100%
  • resist 100%
  1 Citation (Scopus)

  47 Downloads (Pure)
• 2015

  Pattern transfer into silicon using sub-10 nm masks made by electron beam induced deposition

  Scotuzzi, M., Kamerbeek, MJ., Goodyear, A., Cooke, M. & Hagen, CW., 2015, Alternative Lithographic Technologies VII. Resnick, DJ. & Bencher, C. (eds.). Bellingham, WA, USA: SPIE, p. 1-12 12 p. (Proceedings of SPIE- International Society for Optical Engineering; vol. 9423).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access
  3 Citations (Scopus)

• The effect of sidewall roughness on line edge roughness in top-down scanning electron microscopy images

  Verduin, T., Lokhorst, SR., Kruit, P. & Hagen, CW., 2015, Metrology, Inspection, and Process Control for Microlithography XXIX. Cain, JP. & Sanchez, MI. (eds.). Bellingham, WA, USA: SPIE, p. 1-18 18 p. (Proceedings of SPIE- International Society for Optical Engineering; vol. 9424).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  Open Access
  7 Citations (Scopus)
• 2014

  Multi-electron-beam nanoelectronics

  Kruit, P., 2014, Technical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014. nb (ed.). nb: IEEE Society, p. 220-221 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Size and Shape Control of Sub-20 nm Patterns Fabricated Using Focused Electron Beam Induced Processing

  Hari, S., Hagen, CW., Verduin, T. & Kruit, P., 2014, Proc. SPIE 9049, Alternative Lithographic Technologies VI, 90490M. Resnick, D. J. & Bencher, C. (eds.). s.n.: SPIE, p. 1-4 4 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2013

  Error-bars in semi-parametric estimation

  van Ormondt, D., de Beer, R., van der Veen, JWC., Sima, DM. & Graveron-Demilly, D., 2013, Proc. ICTOPEN. s.n. (ed.). s.n.: s.n., p. 1-6 6 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

• Extraction of Glutamate from the GABA-edited spectra

  van der Veen, JWC., van Ormondt, D., de Beer, R. & Shen, J., 2013, Proceedings ISMRM 2013. Gold, GE. & Jones, DK. (eds.). Salt Lake City, UT, USA: ISMRM, p. 1-1 1 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2012

  A large current scanning electron microscope with MEMS-based mutli-beam optics

  Ichimura, T., Ren, Y. & Kruit, P., 2012, Proc. 38th International Conference on Micro & Nano Engineering. s.n. (ed.). s.n.: s.n., p. 1-4 4 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Brightness and energy spread measurements for an I-cathode

  van Kouwen, L., van der Heijden, M. & Kruit, P., 2012, 2012 IEEE 9th International Vacuum Electron Sources Conference, IVESC 2012 , art. no. 6264197 , pp. 463-464. s.n. (ed.). s.n.: IEEE Society, p. 463-464 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2011

  Design and Fabrication of a Miniaturized Gas Ionization Chamber for Production of High Quality Ion Beams

  Jun, DS., Kutchoukov, VG. & Kruit, P., 2011, Proceedings of the 37th International Conference on Micro and Nano Engineering. nn (ed.). Berlin: nn, p. 1-4 4 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2010

  Hundreds of electron beams from a single source

  Kruit, P. & Mohammadi Gheidari, A., 2010, 2010 8th International Vacuum Electron Sources Conference and Nanocarbon.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Professional

• Silicon photodiodes for high-efficiency low-energy electron detection

  Sakic, A., Nanver, LK., Scholtes, TLM., Heerkens, CTH., van Veen, G., Kooijman, K. & Vogelsang, P., 2010, Proceedings of IEEE 40th European Solid-State Device Research Conference (ESSDERC 2010). Huertas Diaz et al, JL. (ed.). Piscataway, NJ, USA: IEEE Society, p. 102-105 4 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
  9 Citations (Scopus)

• Ultrashallow junction silicon photodiodes for detection of low energy electrons

  Sakic, A., Nanver, LK., Scholtes, TLM., Heerkens, CTH., van Veen, G., Kooijman, K. & Vogelsang, P., 2010, Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010. French et al, P. (ed.). Utrecht, The Netherlands: STW, p. 150-153 4 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

  Sakic, A., Nanver, LK., van Veen, G., Kooijman, K., Vogelsang, P., Scholtes, TLM., De Boer, WB., Wien, WHA., Milosavljevic, S., Heerkens, CTH., Knezevic, T. & Spee, I., 2010, Proceedings 2010 IEEE International Electron Devices Meeting (IEDM). S.N. (ed.). Piscataway, NJ, USA: IEEE Society, p. 1-4 4 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  23 Citations (Scopus)
• 2009

  14×14 beams in a scanning electron microscope

  Mohammadi Gheidari, A. & Kruit, P., 20 Jul 2009, 2009 22nd International Vacuum Nanoelectronics Conference.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

  • scanning electron microscopy 100%
  • beams 100%
  • Scanning Electron Microscope 100%
  • Experimental Result 100%
  • Schottky Source 100%
• 2008

  Design of a high brightness multi-electron beam source

  Zhang, Y. & Kruit, P., 2008, Proceedings of the Seventh International Conference on Charged Particle Optics. Munro, E. & Rouse, J. (eds.). London, U.K.: Elsevier, p. 553-563 11 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  12 Citations (Scopus)
• 2005

  Multibeam electron source for nanofrabrication and multibeam imaging

  van Someren, B., van Bruggen, MJ. & Kruit, P., 2005, Proceedings of the NVvM 2005 meeting, Jaarboek 2005. p. 30-31 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

• Nanolithography in an environmental scanning transmission electron microscope

  van Dorp, WF., Hagen, CW., A. Crozier, P., van Someren, B. & Kruit, P., 2005, Proceedings of the NVvM 2005 meeting, Jaarboek 2005. p. 98-99 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

• Resolution limits in electron-beam-induced deposition

  Kruit, P., van Dorp, WF., van Someren, B., Silvis-Cividjian, N. & Hagen, CW., 2005, Proceedings Conference APF 10. Kido, G. (ed.). National Institute of Materials Science, p. 9-16 8 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2004

  Electron beam induced deposition and in-situ inspection of sub-10 nm structures

  van Bruggen, MJ., van Dorp, WF., van Someren, B., Silvis-Cividjian, N., Hagen, CW. & Kruit, P., 2004, Proceedings of the 13th Eurepean Microscopy Congress. p. 175-176 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Electron microlenses and microlens arrays

  van Bruggen, MJ., van Someren, B. & Kruit, P., 2004, Proceedings of the 9th International Seminar "Recent trends in charged particle optics and surface physics instrumentation". Brno: Institure of Scientific Instruments AS CR, p. 17-18 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

• On the performance of an energy filter for a high brightness electron gun

  Cubric, D., van Kranen, SR., Kruit, P. & Kumashiro, S., 2004, Proceedings of the 9th Intern. Seminar 'Recent trends in charged particle optics and surface physics instrumentation'. p. 19-20 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2002

  3D Rapid dynamic imaging using radial scanning

  Lethmate, R., van Osch, JAC., Wajer, FTAW., van Ormondt, D. & Graveron-Demilly, D., 2002, Proceedings of 2002 International Society for Magnetic Resonance in Medicine. CD-rom, p. -

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Accelerated Bayesian MR image reconstruction

  Wajer, FTAW., Coron, A., Lethmate, R., van Osch, JAC., Martinez, LT., Graveron-Demilly, D. & van Ormondt, D., 2002, Proceedings of 2002 International Society for Magnetic Resonance in Medicine. s.n., p. -

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Activity and deactivation of HDS catalysts: studying the active phase using Co as a probe molecule

  Vogelaar, BM., Steiner, P., van Langeveld, AD., Eijsbouts, S. & Moulijn, JA., 2002, Preprints Symposia. Hoffman, JF. & Andrésen, JM. (eds.). Columbus: American Chemical Society (ACS), p. 58-59 2 p. (ACS Symposium Series; vol. 47).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  1 Citation (Scopus)

• Background-signal parameterization in in vivo MR Spectroscopy

  Coenradie, Y., de Beer, R., van Ormondt, D., Ratiney, H., Cavassila, S. & Graveron-Demilly, D., 2002, Proceedings of ProRISC 2002. p. 248-254 7 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Background-signal parametrization in in vivo MR spectroscopy

  Coenradie, Y., de Beer, R., van Ormondt, D., Cavassila, S., Ratiney, H. & Graveron-Demilly, D., 2002, Proceedings of ESMRMB 2002. p. 177-178 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Concept for a low energy foil corrector

  van Aken, RH., Hagen, CW., Barth, JE. & Kruit, P., 2002, Physics and Materials; proceedings of 15th International Congress on Electron Microscopy, Durban, South Africa, 1-6 sept. 2002. p. 1101-1102 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Deactivation of hydrotreating catalysts: Measurement and modeling of coke deposition

  Vogelaar, BM., Gast, J., van Langeveld, AD., Eijsbouts, S. & Moulijn, JA., 2002, 4th International Symposium Catalysis in Multiphase Reactors. Renken, A. & Kiwi-Minsker, L. (eds.). Lausanne: École Polytechnique Fédérale de Lausanne, p. 197-198 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Deactivation of hydrotreating catalysts: the role of coking during liquid phase operation

  Vogelaar, BM., Gast, J., van Langeveld, AD., Eijsbouts, S. & Moulijn, JA., 2002, Preprints Symposia. Hoffman, JF. & Andrésen, JM. (eds.). Columbus: American Chemical Society (ACS), p. 77-78 2 p. (ACS Symposium Series; vol. 47).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Deactivation of hydrotreating catalysts: thiophene HDS and a characterization of spent catalysts

  Steiner, P., Vogelaar, BM., van Langeveld, AD., Eijsbouts, S. & Moulijn, JA., 2002, Preprints Symposia. Hoffman, JF. & Andrésen, JM. (eds.). Columbus: American Chemical Society (ACS), p. 66-68 3 p. (ACS Symposium Series; vol. 47).

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  2 Citations (Scopus)

• Design of an Electron Projection System with Slider Lenses and Multiple Beams

  Moonen, D., Leunissen, LHA., de Jager, PWH., Kruit, P., Bleeker, AJ. & van der Mast, KD., 2002, Proceedings SPIE. SPIE, p. 932-943 12 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• DIY in ICT: faculty members develop their own implementations of ICT in Education

  van Daalen, C., Dopper, S. M., Dijkema, GPJ., de Haan, ARC., Herder, PM., Kruit, P. & Sjoer, E., 2002, The Renaissance Engineer of Tomorrow. C Borri & TU Weck (eds.). Firenze: Edizioni Polistampa, p. 1-8 8 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Dynamic MR-Imaging with radial scanning, a post-acquisition keyhole approach

  Lethmate, R., van Osch, JAC., Wajer, FTAW., Cremillieux, Y., van Ormondt, D. & Graveron-Demilly, D., 2002, Magnetic Resonance Materials in Physics, Biology andMedicine, Vol 15 suppl.1. Proceedings of ESMRMB 2002. Elsevier, p. 71-72 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Modeling based image reconstruction in time-resolved contrast-enhanced magnetic resonance angiography (CE-MRA)

  Wajer, FTAW., van den Brink, J., Fuderer, M., van Ormondt, D., van Osch, JAC. & de Beer, R., 2002, Proceedings of ProRISC 2002. p. 531-537 7 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• New image reconstruction method for 3D-Tricks based contrast enhanced magnetic resonance angiography measurements

  Wajer, FTAW., van Osch, JAC., van den Brink, J., Fuderer, M., van Ormondt, D. & de Beer, R., 2002, Proceedings of 2002 International Society for Magnetic Resonance in Medicine. s.n., p. -

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• QUEST: time-domain quantitation with advanced prior knowledge

  Ratiney, H., Mitri, F., Coenradie, Y., Cavassila, S., van Ormondt, D. & Graveron-Demilly, D., 2002, Proceedings of ESMRMB 2002. p. 179-180 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Scanning transmission electron microscopy at sub-eV energy

  Rensen, M. J. M., van Aken, RH., Hagen, CW. & Kruit, P., 2002, Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. L. Frank (ed.). Brno: Czechoslovak Microscopy Society, p. S-5-S-6

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Selective hydrogenation of glucose to sorbitol - comparison between carbon supported Ru and Raney-type Ni catalysis

  Hoffer, BW., Crezee, E., Mooijman, PRM., van Langeveld, AD., Kapteijn, F. & Moulijn, JA., 2002, 4th International Symposium Catalysis in Multiphase Reactors. Renken, A. & Kiwi-Minsker, L. (eds.). Lausanne: École Polytechnique Fédérale de Lausanne, p. 9-10 2 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

• Time-domain quantitation based on a metabolite basis set in magnetic resonance spectroscopy

  Ratiney, H., Mitri, F., Coenradie, Y., Cavassila, S., van Ormondt, D. & Graveron-Demilly, D., 2002, Proceedings of ProRISC 2002. p. 432-437 6 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
• 2001

  3D Rapid Radial Dynamic MR-Imaging.

  Lethmate, R., van Osch, JAC., Wajer, FTAW., van Ormondt, D. & Graveron-Demilly, D., 2001, Proceedings of ProRISC 2001.. p. 489-495 7 p.

  Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific