Research output per year
Research output per year
Personal profile
Research interests
Charged Particle Optics (Theory, Design/Simulation, Experimentation/Instrumentaion), MEMS electron/ion optics, Quantum Electron Microscopy (QEM), Multi Beam Systems.
Education/Academic qualification
Multi Beam Scanning Electron Microscope (MBSEM), Delft University of Technology
2 Apr 2007 → 13 Nov 2013
Award Date: 13 Nov 2013
External positions
Scientist, ThermoFisher Scientific
2011 → …
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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In multi electron beam systems, “Neighbours Matter”
Mohammadi-Gheidari, A., Kieft, E. R., Guo, X., Wisse, M. & Kruit, P., 2023, In: Ultramicroscopy. 249, 17 p., 113735.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile73 Downloads (Pure) -
Multiple criteria optimization of electrostatic electron lenses using multiobjective genetic algorithms
Hesam Mahmoudi Nezhad, N., Ghaffarian Niasar, M., Mohammadi Gheidari, A., Kruit, P. & Hagen, C. W., 2021, In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 39, 6, 10 p., 062605.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile3 Citations (Scopus)103 Downloads (Pure) -
Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets
Kruit, P., Mohammadi Gheidari, A. & Kieft, E. R., 2020, IPC No. H01J, G21K, Patent No. US 11961709 B2, Priority date 27 Feb 2019Research output: Patent
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Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets
Kruit, P., Mohammadi Gheidari, A. & Kieft, E. R., 2020, IPC No. H01J, G21K, Priority date 27 Feb 2019, Priority No. US 2020273667 A1Research output: Patent
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Sub-Ångstrom EDX Mapping Enabled by a High-Brightness Cold Field Emission Source
Goodge, B., Carlsson, A., Bischoff, M., Mohammadi-Gheidari, A., Fallag, G., Schwind, G., Maunders, C., Muller, D. & Kourkoutis, L., 2020, In: Microscopy and Microanalysis. 589.Research output: Contribution to journal › Article › Scientific › peer-review
3 Citations (Scopus)
Activities
- 1 Publication peer-review
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Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures (Journal)
A. Mohammadi Gheidari (Editor)
2011Activity: Publication peer-review and editorial work › Publication peer-review