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A. van Keulen
Prof.dr.ir.
Mechanical Engineering
https://orcid.org/0000-0003-2634-0110
Overview
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Network
Research output
(385)
Prizes
(1)
Activities
(10)
Press/Media
(3)
Similar Profiles
(12)
Supervised Work
(42)
Research output
185
Conference contribution
155
Article
25
Abstract
7
Patent
13
More
6
Chapter
5
Poster
1
Report
1
Comment/Letter to the editor
Research output per year
Research output per year
7 results
Publication Year, Title
(ascending)
Publication Year, Title
(descending)
Title
Type
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Patent
Search results
2003
Werkwijze voor het vervaardigen van een product onder gebruikmaking van een doorn
van Keulen, A.
&
Weustink, APD.
,
2003
, IPC No. niet eerder opgenomen, Patent No. 1022244, Priority date
23 Dec 2002
Research output
:
Patent
2004
Werkwijze voor het vervaardigen van een product onder gebruikmaking van een doorn
van Keulen, A.
&
Weustink, APD.
,
2004
, Patent No. 1022244, Priority date
24 Jun 2004
Research output
:
Patent
2009
Method for measuring a temperature, electromechanical device for measuring a temperature
Sadeghian Marnani, H.
,
van Keulen, F.
,
Yang, CK.
,
Goosen, JFL.
&
Bossche, A.
,
2009
, IPC No. Op naam van TU Delft, Patent No. 2003431, Priority date
3 Sept 2009
Research output
:
Patent
System and method for micro- and nanoelectromechanical sample mass measurement
Sadeghian Marnani, H.
,
Yang, CK.
,
van Keulen, F.
,
Goosen, JFL.
,
Bossche, A.
&
French, PJ.
,
2009
, IPC No. Op naam van TU Delft, Patent No. 2003643, Priority date
14 Oct 2009
Research output
:
Patent
2010
Method for determining a spring constant for a deformable scanning probe microscope element, and scanning probe microscope and calibration device arranged for determing a spring constant for a probe element
Sadeghian Marnani, H.
,
Yang, C.
,
van Keulen, F.
,
Goosen, JFL.
&
Bossche, A.
,
2010
, Patent No. 2005687, Priority date
12 Nov 2010
Research output
:
Patent
calibration
100%
springs
100%
microscopes
100%
devices
100%
probes
100%
2012
A method to calibrate spring constant of cantilevers used in scanning force microscopy
Bossche, A.
,
Goosen, JFL.
,
Sadeghian Marnani, H.
,
Yang, CK.
,
van Keulen, A.
&
French, PJ.
,
2012
, Patent No. 2005687, Priority date
12 Nov 2010
Research output
:
Patent
2013
Method for determining a spring constant of an atomic force microscopy using coupling electrostatic pull-in instability and resonance frequency
Sadeghian Marnani, H.
&
van Keulen, F.
,
2013
, IPC No. OCT-11-017, Patent No. 2009014, Priority date
17 Dec 2013
Research output
:
Patent