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B. Rieger
Dr.
Applied Sciences
,
ImPhys/Computational Imaging
Applied Sciences
,
ImPhys/Rieger group
https://orcid.org/0000-0001-9215-9307
Overview
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Research output
(115)
Datasets
(7)
Press/Media
(2)
Similar Profiles
(12)
Supervised Work
(11)
Research output
77
Article
13
Conference contribution
4
Report
4
Comment/Letter to the editor
17
More
3
Chapter
3
Conference article
3
Patent
2
Abstract
2
Poster
1
Meeting Abstract
1
Letter
1
Dissertation (TU Delft)
1
Preprint
Research output per year
Research output per year
3 results
Publication Year, Title
(descending)
Publication Year, Title
(ascending)
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Patent
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2015
Method for adjusting a stem equipped with an aberration corrector
Bischoff, M.
&
Rieger, B.
,
2015
, IPC No. Aangevraagd door FEI Company, Patent No. US9029767, Priority date
12 May 2015
Research output
:
Patent
2014
Method for determining distortions in a particle-optical apparatus
van der Stam, M.
&
Rieger, B.
,
2014
, IPC No. Aanvrager: FEI Company. Niet eerder opgenomen., Patent No. US 8885973 B2, Priority date
11 Nov 2014
Research output
:
Patent
2009
Method for determining the aberration coefficients of the aberration function of a particle-opticle lens
Zande, M.
,
Kok, C.
&
Rieger, B.
,
2009
, IPC No. Aanvrager: Fei Company, Patent No. EP 1804272 B1, Priority date
1 Jul 2009
Research output
:
Patent