If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where C. De Martino is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 22 Similar Profiles

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output

  • 6 Conference contribution
  • 3 Article

Automated Contacting of On-Wafer Devices for RF Testing

Mubarak, F., Martino, C. D., Toskovic, R., Rietveld, G. & Spirito, M., 2020, 2020 Conference on Precision Electromagnetic Measurements (CPEM). Danvers: Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p. 9191800

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Hardware and Software Solutions for Active Frequency Scalable (Sub)mm-Wave Load-Pull

    De Martino, C., Galatro, L., Romano, R., Parisi, G. & Spirito, M., 2020, In : IEEE Transactions on Microwave Theory and Techniques. 68, 9, p. 3769-3775 7 p., 9133287.

    Research output: Contribution to journalArticleScientificpeer-review

  • A TRL Error-box Split Procedure to Compensate for the Bias Dependency Effects in Device Test-Fixtures

    de Martino, C., Malotaux, E. S. & Spirito, M., 2019, 2019 93rd ARFTG Microwave Measurement Conference (ARFTG): Measurement Challenges for the Upcoming RF and mm-Wave Communications and Sensing Systems. Danvers: IEEE, p. 1-6 6 p. 8739197

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Direct mm-Wave On-Wafer Power Calibration Employing CMOS as a Transfer Device

    De Martino, C., Malotaux, E. S., Galatro, L. & Spirito, M., 2018, 2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018. Schreurs, D., Rumiantsev, A. & Teyssier, J-P. (eds.). Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 4 p. 8423821

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review