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Fingerprint Dive into the research topics where C.R. Wedig Reinbrecht is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

  • 6 Conference contribution

A Security Verification Template to Assess Cache Architecture Vulnerabilities

Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
File
  • 1 Citation (Scopus)
    14 Downloads (Pure)

    G-PUF: An Intrinsic PUF Based on GPU Error Signatures

    Forlin, B., Husemann, R., Carro, L., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-2 2 p. 9131562

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Guard-NoC: A protection against side-channel attacks for MPSoCs

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M., Forlin, B. E. & Sepulveda, J., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Pisacataway: IEEE, p. 536-541 6 p. 9154989

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 2 Downloads (Pure)

    LiD-CAT: A Lightweight Detector for Cache ATtacks

    Reinbrecht, C., Hamdioui, S., Taouil, M., Niazmand, B., Ghasempouri, T., Raik, J. & Sepulveda, J., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131603

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 2 Downloads (Pure)

    Towards Reliable and Secure Post-Quantum Co-Processors based on RISC-V

    Fritzmann, T., Sharif, U., Müller-Gritschneder, D., Reinbrecht, C., Schlichtmann, U. & Sepulveda, J., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings . IEEE, p. 1148-1153 6 p. 8715173

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • 2 Citations (Scopus)