20172020

Research output per year

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Research Output

  • 8 Conference contribution
  • 5 Article

ESRAM Reliability: Why is it still not optimally solved?

Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Mitigation of Sense Amplifier Degradation Using Skewed Design

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1614-1617 4 p. 9116532. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Hardware-based aging mitigation scheme for memory address decoder

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 IEEE European Test Symposium (ETS). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 28 Downloads (Pure)

    Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 162-167 6 p. 8715143

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • 3 Citations (Scopus)

    Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

    Kraak, D., Taouil, M., Agbo, I., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Jun 2019, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27, 6, p. 1308-1321 14 p., 8678671.

    Research output: Contribution to journalArticleScientificpeer-review

  • 2 Citations (Scopus)