E. Rull Trinidad

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  • 2015

    Continuous monitoring of tip radius during atomic force microscopy imaging

    Fraxedas, J., Perez-Murano, F., Gramazio, F., Lorenzoni, M., Rull Trinidad, E. & Staufer, U., 2015, Proceedings of SPIE - Scanning Microscopies 2015. Postek, MT., Newbury, DE., Platek, SF. & Maugel, TK. (eds.). Bellingham, WA, USA: SPIE, p. 1-7 7 p. (Proceedings of SPIE- International Society for Optical Engineering; vol. 9636).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    4 Citations (Scopus)