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Fingerprint Dive into the research topics where G. Cardoso Medeiros is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

  • 5 Conference contribution
  • 2 Article

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • 1 Citation (Scopus)

    Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

    Copetti, T., Medeiros, G. C., Taouil, M., Hamdioui, S., Poehls, L. B. & Balen, T., 1 Mar 2020, 21st IEEE Latin-American Test Symposium, LATS 2020. Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9093667

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 6 Downloads (Pure)

    Defect and Fault Modeling Framework for STT-MRAM Testing

    Wu, L., Rao, S., Taouil, M., Cardoso Medeiros, G., Fieback, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 17 Dec 2019, In : IEEE Transactions on Emerging Topics in Computing. 15 p.

    Research output: Contribution to journalArticleScientificpeer-review

    Open Access
    File
  • 19 Downloads (Pure)

    Device-Aware Test: A New Test Approach Towards DPPB Level

    Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 22 Downloads (Pure)

    DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Cardoso Medeiros, G., Taouil, M., Fieback, M., Bolzani Poehls, L. M. & Hamdioui, S., 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019: Proceedings. IEEE, Vol. 2019-May. p. 1-2 2 p. 8791517

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 3 Citations (Scopus)
    60 Downloads (Pure)