Research output per year
Research output per year
Search results
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2008
Thermal contrained thin film m
Goosen, JFL., 2008, IPC No. TU Delft, Patent No. 2000209, Priority date 5 Mar 2008Research output: Patent
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2009
Method for measuring a temperature, electromechanical device for measuring a temperature
Sadeghian Marnani, H., van Keulen, F., Yang, CK., Goosen, JFL. & Bossche, A., 2009, IPC No. Op naam van TU Delft, Patent No. 2003431, Priority date 3 Sep 2009Research output: Patent
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System and method for micro- and nanoelectromechanical sample mass measurement
Sadeghian Marnani, H., Yang, CK., van Keulen, F., Goosen, JFL., Bossche, A. & French, PJ., 2009, IPC No. Op naam van TU Delft, Patent No. 2003643, Priority date 14 Oct 2009Research output: Patent
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2010
Device, system and method for the measurement of a vapor transmission rate through a film of permeable material
Li, Q., Goosen, JFL. & van de Sanden, MCM., 2010, Patent No. NL2004419, Priority date 17 Mar 2010Research output: Patent
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Method for determining a spring constant for a deformable scanning probe microscope element, and scanning probe microscope and calibration device arranged for determing a spring constant for a probe element
Sadeghian Marnani, H., Yang, C., van Keulen, F., Goosen, JFL. & Bossche, A., 2010, Patent No. 2005687, Priority date 12 Nov 2010Research output: Patent
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2012
A method to calibrate spring constant of cantilevers used in scanning force microscopy
Bossche, A., Goosen, JFL., Sadeghian Marnani, H., Yang, CK., van Keulen, A. & French, PJ., 2012, Patent No. 2005687, Priority date 12 Nov 2010Research output: Patent