J.H.M. van der Linden - TU Delft Research Portal

1 Chapter

Compensation of High-Frequency Disturbances in Scanning Microscopes
Kruit, P., van Ravesteijn, VF., Rieger, B., Berwald, F. & van der Linden, JHM., 2012, From Scientific Instrument to Industrial Machine Coping with Architectural Stress in Embedded Systems. Doornbos, R. & van Loo, S. (eds.). s.n.: Springer, p. 98-102 112 p.
Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific