L. Han

Dr.

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Analysis and Modeling of Spill Back Effect in High Illumination CMOS Image Sensors
Xu, J., Wang, R., Han, L. & Gao, Z., 2020, In : IEEE Sensors Journal. 20, 6, p. 3024-3031 8 p., 8917594.
Research output: Contribution to journal › Article › Scientific › peer-review
Analysis of signal attenuation in global shutter CMOS image sensor
Xu, J., Li, F., Han, L., Gao, Z. & Wang, H., 2020, In : Microelectronics Reliability. 109, p. 1-8 8 p., 113678.
Research output: Contribution to journal › Article › Scientific › peer-review
Development and Evaluation of a Highly Linear CMOS Image Sensor with a Digitally Assisted Linearity Calibration
Wang, F., Han, L. & Theuwissen, A. J. P., 2018, In : IEEE Journal of Solid-State Circuits. 53, 10, p. 2970-2981 12 p., 8436448.
Research output: Contribution to journal › Article › Scientific › peer-review
7 Citations (Scopus)
A Charge Transfer Model for CMOS Image Sensors
Han, L., Yao, S. & Theuwissen, AJP., 28 Jul 2016, In : IEEE Transactions on Electron Devices. 63, 1, p. 32-41 10 p.
Research output: Contribution to journal › Article › Scientific › peer-review
16 Citations (Scopus)

A highly linear CMOS image sensor with a digitally assisted linearity-calibration method
Fei Wang (Speaker), , Liqiang Han (Speaker), & Albert Theuwissen (Speaker)
30 May 2017 → 2 Jun 2017
Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting