Research output per year
Research output per year
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Dive into the research topics where L. Wu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Research output
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Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2021, 2020 IEEE International Test Conference, ITC 2020. IEEE , p. 1-10 10 p. 9325258. (Proceedings - International Test Conference; vol. 2020-November).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open AccessFile -
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
Wu, L., 2021, 204 p.Research output: Thesis › Dissertation (TU Delft)
Open AccessFile -
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
1 Citation (Scopus) -
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level
Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open AccessFile -
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE , Vol. 2020-April. 9107595Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
2 Citations (Scopus)
Prizes
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DATE'20 Best Paper Award
Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020
Prize: Prize (including medals and awards)
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