Research Output per year
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Research Output
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
1
Citation
(Scopus)
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level
Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open Access
File
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE, Vol. 2020-April. 9107595Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Defect and Fault Modeling Framework for STT-MRAM Testing
Wu, L., Rao, S., Taouil, M., Cardoso Medeiros, G., Fieback, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 17 Dec 2019, In : IEEE Transactions on Emerging Topics in Computing. 15 p.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access
File
Device-Aware Test: A New Test Approach Towards DPPB Level
Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open Access
File
Prizes
DATE'20 Best Paper Award
Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020
Prize: Prize (including medals and awards)
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