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Research Output

  • 6 Conference contribution
  • 1 Article
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Conference contribution
2020

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
File
7 Downloads (Pure)

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE, Vol. 2020-April. 9107595

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2019

Device-Aware Test: A New Test Approach Towards DPPB Level

Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
File
25 Downloads (Pure)

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
2018

Electrical Modeling of STT-MRAM Defects

Wu, L., Taouil, M., Rao, S., Marinissen, E. J. & Hamdioui, S., 2018, International Test Conference - Proceedings. Piscataway, NJ: IEEE, p. 1-10 10 p. 3.2

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
40 Downloads (Pure)