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Research Output

  • 6 Conference contribution
  • 1 Article
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2019

Defect and Fault Modeling Framework for STT-MRAM Testing

Wu, L., Rao, S., Taouil, M., Cardoso Medeiros, G., Fieback, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 17 Dec 2019, In : IEEE Transactions on Emerging Topics in Computing. 15 p.

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