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Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS
Ilik, S. (Creator), Kiene, G. (Creator), Mastrodomenico, L. P. (Creator), Babaie, M. (Creator) & Sebastiano, F. (Creator), TU Delft - 4TU.ResearchData, 1 Aug 2024
DOI: 10.4121/C41C26F7-586F-48CA-8ABE-9127B2D97C60
Dataset/Software: Dataset