Research output per year
Research output per year
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Dive into the research topics where M. Taouil is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2022, In: IEEE Transactions on Computers. 71, 9, p. 2219-2233 15 p.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile2 Downloads (Pure) -
Defects, Fault Modeling, and Test Development Framework for RRAMs
Fieback, M., Medeiros, G. C., Wu, L., Aziza, H., Bishnoi, R., Taouil, M. & Hamdioui, S., 28 Apr 2022, In: ACM Journal on Emerging Technologies in Computing Systems. 18, 3, 26 p., 52.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile2 Downloads (Pure) -
Exploiting PUF Variation to Detect Fault Injection Attacks
Köylü, T., Garaffa, L., Reinbrecht, C., Zahedi, M., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Kubatova, H., Steininger, A., Jenihhin, M., Garbolino, T., Fiser, P., Belohoubek, J. & Borecky, J. (eds.). Danvers: IEEE , p. 74-79 6 p. (Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open AccessFile25 Downloads (Pure) -
Hierarchical Memory Diagnosis
Medeiros, G. C., Fieback, M., Gebregiorgis, A., Taouil, M., Poehls, L. B. & Hamdioui, S., 2022, Proceedings - 2022 IEEE European Test Symposium, ETS 2022. Institute of Electrical and Electronics Engineers (IEEE), 2 p. (Proceedings of the European Test Workshop; vol. 2022-May).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Instruction Flow-based Detectors against Fault Injection Attacks
Köylü, T. Ç., Reinbrecht, C., Brandalero, M., Hamdioui, S. & Taouil, M., 2022, In: Microprocessors and Microsystems. 94, 14 p., 104638.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile11 Downloads (Pure)
Prizes
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DATE'20 Best Paper Award
Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020
Prize: Prize (including medals and awards)
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Activities
- 2 Talk or presentation at a workshop, seminar, course or other meeting
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CIM Based Parallel Adder Implementations and Evaluations
Hoang Anh Du Nguyen (Speaker), Lei Xie (Speaker), Mottaqiallah Taouil (Speaker), Said Hamdioui (Speaker) & Koen Bertels (Speaker)
20 Jan 2016Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting
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Impact of BTI on SRAM sense amplifier in the presence of temperature and process variation
M. Taouil (Speaker)
2014 → …Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting