Research Output per year
Fingerprint Dive into the research topics where M. Taouil is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Research Output
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
1
Citation
(Scopus)
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)
Aziza, H., Moreau, M., Fieback, M., Taouil, M. & Hamdioui, S., 2020, In : IEEE Access. 8, p. 137263-137274 12 p., 9146996.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access
File
A Security Verification Template to Assess Cache Architecture Vulnerabilities
Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open Access
File
1
Citation
(Scopus)
11
Downloads
(Pure)
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level
Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open Access
File
ESRAM Reliability: Why is it still not optimally solved?
Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Prizes
DATE'20 Best Paper Award
Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020
Prize: Prize (including medals and awards)
File
Activities
- 2 Talk or presentation at a workshop, seminar, course or other meeting
CIM Based Parallel Adder Implementations and Evaluations
Hoang Anh Du Nguyen (Speaker), , Lei Xie (Speaker), , Mottaqiallah Taouil (Speaker), , Said Hamdioui (Speaker), & Koen Bertels (Speaker)
20 Jan 2016
Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting
Impact of BTI on SRAM sense amplifier in the presence of temperature and process variation
M. Taouil (Speaker)
2014 → …
Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting