Research output per year
Research output per year
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Dive into the research topics where M. Taouil is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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A Survey on Machine Learning in Hardware Security
Köylü, T. C., Reinbrecht, C., Gebregiorgis, A. B., Hamdioui, S. & Taouil, M., 2023, In: ACM Journal on Emerging Technologies in Computing Systems. 19, 2, 37 p., 18.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile57 Downloads (Pure) -
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs
Xun, H., Fieback, M., Yuan, S., Zhang, Z., Taouil, M. & Hamdioui, S., 2023, Proceedings of the 2023 IEEE European Test Symposium (ETS). IEEE , 6 p. (Proceedings of the European Test Workshop; vol. 2023-May).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Dependability of Future Edge-AI Processors: Pandora’s Box
Gomony, M. D., Gebregiorgis, A., Fieback, M., Geilen, M., Stuijk, S., Richter-Brockmann, J., Bishnoi, R., Taouil, M., Hamdioui, S. & More Authors, 2023, Proceedings of the 2023 IEEE European Test Symposium (ETS). IEEE , 6 p. (Proceedings of the European Test Workshop; vol. 2023-May).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Yuan, S., Taouil, M., Fieback, M., Xun, H., Marinissen, E. J., Kar, G. S., Rao, S., Couet, S. & Hamdioui, S., 2023, 2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), 6 p. (Proceedings -Design, Automation and Test in Europe, DATE; vol. 2023-April).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Online Fault Detection and Diagnosis in RRAM
Fieback, M., Bradarić, F., Taouil, M. & Hamdioui, S., 2023, Proceedings of the 2023 IEEE European Test Symposium (ETS). IEEE , 6 p. (Proceedings of the European Test Workshop; vol. 2023-May).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Prizes
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DATE'20 Best Paper Award
Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020
Prize: Prize (including medals and awards)
File -
ETS 2021 Best Paper Award
Fieback, M.C.R. (Recipient), Cardoso Medeiros, G. (Recipient), Gebregiorgis, A. B. (Recipient), Aziza, H. (Recipient), Taouil, M. (Recipient) & Hamdioui, S. (Recipient), May 2022
Prize: Prize (including medals and awards)
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LATS 2018 Best Paper Award
Fieback, M.C.R. (Recipient), Taouil, M. (Recipient), Hamdioui, S. (Recipient) & Rovatti, M. (Recipient), 2018
Prize: Prize (including medals and awards)
Activities
- 2 Talk or presentation at a workshop, seminar, course or other meeting
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CIM Based Parallel Adder Implementations and Evaluations
Hoang Anh Du Nguyen (Speaker), Lei Xie (Speaker), Mottaqiallah Taouil (Speaker), Said Hamdioui (Speaker) & Koen Bertels (Speaker)
20 Jan 2016Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting
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Impact of BTI on SRAM sense amplifier in the presence of temperature and process variation
M. Taouil (Speaker)
2014 → …Activity: Talk or presentation › Talk or presentation at a workshop, seminar, course or other meeting