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Research Output

  • 73 Conference contribution
  • 21 Article
  • 3 Patent
  • 1 Dissertation (TU Delft)

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • 1 Citation (Scopus)

    An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)

    Aziza, H., Moreau, M., Fieback, M., Taouil, M. & Hamdioui, S., 2020, In : IEEE Access. 8, p. 137263-137274 12 p., 9146996.

    Research output: Contribution to journalArticleScientificpeer-review

    Open Access
    File
  • 4 Downloads (Pure)

    A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 1 Citation (Scopus)
    15 Downloads (Pure)

    Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 8 Downloads (Pure)

    ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Prizes

    DATE'20 Best Paper Award

    Wu, L. (Recipient), Hamdioui, S. (Recipient) & Taouil, M. (Recipient), 13 Mar 2020

    Prize: Prize (including medals and awards)

    File
  • Activities

    • 2 Talk or presentation at a workshop, seminar, course or other meeting

    CIM Based Parallel Adder Implementations and Evaluations

    Hoang Anh Du Nguyen (Speaker), , Lei Xie (Speaker), , Mottaqiallah Taouil (Speaker), , Said Hamdioui (Speaker), & Koen Bertels (Speaker)

    20 Jan 2016

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting

    Impact of BTI on SRAM sense amplifier in the presence of temperature and process variation

    M. Taouil (Speaker)

    2014 → …

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting