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M. Taouil, MSc

 https://orcid.org/0000-0002-9911-4846
  • 109 Conference contribution
  • 35 Article
  • 9 Patent
  • 1 Dissertation (TU Delft)
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  • 2019

    A Computation-In-Memory Accelerator Based on Resistive Devices

    Du Nguyen, H. A., Yu, J., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, Proceedings of the International Symposium on Memory Systems. New York: Association for Computing Machinery (ACM), p. 19-32 14 p. (ICPS: ACM International Conference Proceeding Series).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)
    2 Downloads (Pure)

  • Applications of Computation-In-Memory Architectures based on Memristive Devices

    Hamdioui, S., Du Nguyen, H. A., Taouil, M., Sebastian, A., Le Gallo, M., Pande, S., Schaafsma, S., Catthoor, F., Das, S., G. Redondo, F., Karunaratne, G., Rahimi, A. & Benini, L., 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019: Proceedings. IEEE, p. 486-491 6 p. 8715020

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    33 Citations (Scopus)
    997 Downloads (Pure)

  • Device-Aware Test: A New Test Approach Towards DPPB Level

    Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference, ITC 2019. IEEE, 10 p. 9000134. (Proceedings - International Test Conference; vol. 2019-November).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    38 Citations (Scopus)
    137 Downloads (Pure)

  • DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Cardoso Medeiros, G., Taouil, M., Fieback, M., Bolzani Poehls, L. M. & Hamdioui, S., 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019: Proceedings. IEEE, Vol. 2019-May. p. 1-2 2 p. 8791517

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    204 Downloads (Pure)

  • Hardware-based aging mitigation scheme for memory address decoder

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 IEEE European Test Symposium (ETS). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    65 Downloads (Pure)

  • Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 162-167 6 p. 8715143

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    15 Citations (Scopus)

  • Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    4 Citations (Scopus)
    106 Downloads (Pure)

  • Testing Computation-in-Memory Architectures Based on Emerging Memories

    Hamdioui, S., Fieback, M., Nagarajan, S. & Taouil, M., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p. 9000117

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    13 Citations (Scopus)
    173 Downloads (Pure)

  • Time-division Multiplexing Automata Processor

    Yu, J., Du Nguyen, H. A., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) : Proceedings. IEEE, p. 794-799 6 p. 8715140

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    233 Downloads (Pure)
  • 2020

    A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    5 Citations (Scopus)
    40 Downloads (Pure)

  • A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    101 Downloads (Pure)

  • Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    89 Downloads (Pure)

  • ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

    Copetti, T., Medeiros, G. C., Taouil, M., Hamdioui, S., Poehls, L. B. & Balen, T., 1 Mar 2020, 21st IEEE Latin-American Test Symposium, LATS 2020. Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9093667

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    6 Citations (Scopus)
    54 Downloads (Pure)

  • G-PUF: An Intrinsic PUF Based on GPU Error Signatures

    Forlin, B., Husemann, R., Carro, L., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-2 2 p. 9131562

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Guard-NoC: A protection against side-channel attacks for MPSoCs

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M., Forlin, B. E. & Sepulveda, J., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Pisacataway: IEEE, p. 536-541 6 p. 9154989. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    134 Downloads (Pure)

  • Impact of Magnetic Coupling and Density on STT-MRAM Performance

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Grenoble, France: IEEE, p. 1211-1216 6 p. 9116444

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    42 Downloads (Pure)

  • LiD-CAT: A Lightweight Detector for Cache ATtacks

    Reinbrecht, C., Hamdioui, S., Taouil, M., Niazmand, B., Ghasempouri, T., Raik, J. & Sepulveda, J., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131603

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    107 Downloads (Pure)

  • Mitigation of Sense Amplifier Degradation Using Skewed Design

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1614-1617 4 p. 9116532. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Modeling Static Noise Margin for FinFET based SRAM PUFs

    Masoumian, S., Selimis, G., Maes, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131583

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    5 Citations (Scopus)
    236 Downloads (Pure)

  • RNN-based Detection of Fault Attacks on RSA

    Köylü, T. C., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, p. 1-5 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    145 Downloads (Pure)

  • S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX

    Aljuffri, A., Venkatachalam, P., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, Embedded Computer Systems: Architectures, Modeling, and Simulation - 20th International Conference, SAMOS 2020, Proceedings. Orailoglu, A., Jung, M. & Reichenbach, M. (eds.). Springer, p. 295-307 13 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 12471 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Testing Scouting Logic-Based Computation-in-Memory Architectures

    Fieback, M., Nagarajan, S., Bishnoi, R., Tahoori, M., Taouil, M. & Hamdioui, S., 2020, Proceedings - 2020 IEEE European Test Symposium, ETS 2020: Proceedings. IEEE, p. 1-6 6 p. 9131604. (Proceedings of the European Test Workshop; vol. 2020-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    12 Citations (Scopus)

  • The Power of Computation-in-Memory Based on Memristive Devices

    Yu, J., Abu Lebdeh, M., Du Nguyen, H. A., Taouil, M. & Hamdioui, S., 15 Jan 2020, 25th Asia and South Pacific Design Automation Conference (ASP-DAC). IEEE, p. 385-392 8 p. 9045162

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    122 Downloads (Pure)
  • 2021

    Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2021, 2020 IEEE International Test Conference, ITC 2020. IEEE, p. 1-10 10 p. 9325258. (Proceedings - International Test Conference; vol. 2020-November).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    139 Downloads (Pure)

  • Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2021, Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021. IEEE, p. 1717-1722 6 p. 9473999. (Proceedings -Design, Automation and Test in Europe, DATE; vol. 2021-February).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    4 Citations (Scopus)
    86 Downloads (Pure)

  • Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation

    Aziza, H., Hamdioui, S., Fieback, M., Taouil, M. & Moreau, M., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 1877-1880 4 p. 9473967

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    6 Citations (Scopus)

  • Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

    Cardoso Medeiros, G., Fieback, M., Gebregiorgis, A., Taouil, M., Bolzani Poehls, L. & Hamdioui, S., 2021, 2021 IEEE European Test Symposium (ETS). Danvers: IEEE, 6 p. 9465441

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    65 Downloads (Pure)

  • Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks

    Köylü, T. C., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 18th International Conference on Privacy, Security and Trust (PST). Piscataway: IEEE, p. 1-10 10 p. (2021 18th International Conference on Privacy, Security and Trust, PST 2021).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    24 Downloads (Pure)

  • GRINCH: A Cache Attack against GIFT Lightweight Cipher

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 549-554 6 p. 9474201

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    3 Citations (Scopus)

  • Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks

    Aljuffri, A. A. M., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Improving the Detection of Undefined State Faults in FinFET SRAMs

    Cardoso Medeiros, G., Fieback, M., Copetti, T., Gebregiorgis, A. B., Taouil, M., Bolzani Poehls, L. M. & Hamdioui, S., 2021, International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS). 16th ed. IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    48 Downloads (Pure)

  • Intermittent Undefined State Fault in RRAMs

    Fieback, M., Cardoso Medeiros, G., Gebregiorgis, A., Aziza, H., Taouil, M. & Hamdioui, S., 2021, 2021 IEEE European Test Symposium (ETS). Danvers: IEEE, 6 p. 9465401

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    10 Citations (Scopus)
    33 Downloads (Pure)

  • LightRoAD: Lightweight Rowhammer Attack Detector

    Taouil, M., Reinbrecht, C., Hamdioui, S. & Sepulveda, J., 2021, Proceedings - 2021 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2021: Proceedings. Ceballos, C. (ed.). Piscataway: IEEE, p. 362-367 6 p. 9516766. (Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI; vol. 2021-July).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    78 Downloads (Pure)

  • Multi-bit blinding: A countermeasure for RSA against side channel attacks

    Aljuffri, A., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 IEEE 39th VLSI Test Symposium (VTS). Piscataway: IEEE, 6 p. 9441035

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Power Side Channel Attacks: Where Are We Standing?

    Taouil, M., Aljuffri, A. A. M. & Hamdioui, S., 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    10 Citations (Scopus)

  • Protecting IoT Devices through a Hardware-driven Memory Verification

    Köylü, T. Ç., Okkerman, H., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 115-122 8 p. 9556394

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    101 Downloads (Pure)

  • Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron

    Caetano Garaffa, L., Aljuffri, A., Reinbrecht, C., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 24th Euromicro Conference on Digital System Design (DSD): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 514-518 5 p. 9556441

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    7 Citations (Scopus)
    194 Downloads (Pure)
  • 2022

    Balanced Dual-Mask Protection Scheme for GIFT Cipher Against Power Attacks

    Aljuffri, A. A. M., Reinbrecht, C., Hamdioui, S., Taouil, M. & Sepulveda, J., 2022, 2022 IEEE 40th VLSI Test Symposium (VTS). 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    30 Downloads (Pure)

  • Exploiting PUF Variation to Detect Fault Injection Attacks

    Köylü, T., Garaffa, L., Reinbrecht, C., Zahedi, M., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). Kubatova, H., Steininger, A., Jenihhin, M., Garbolino, T., Fiser, P., Belohoubek, J. & Borecky, J. (eds.). Danvers: IEEE, p. 74-79 6 p. (Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    91 Downloads (Pure)

  • Hierarchical Memory Diagnosis

    Medeiros, G. C., Fieback, M., Gebregiorgis, A., Taouil, M., Poehls, L. B. & Hamdioui, S., 2022, Proceedings - 2022 IEEE European Test Symposium, ETS 2022. Institute of Electrical and Electronics Engineers (IEEE), 2 p. (Proceedings of the European Test Workshop; vol. 2022-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    14 Downloads (Pure)

  • On BTI Aging Rejuvenation in Memory Address Decoders

    Cem Gursoy, C., Kraak, D., Ahmed, F., Taouil, M., Jenihhin, M. & Hamdioui, S., 2022, Proceedings of the 2022 IEEE 23rd Latin American Test Symposium (LATS). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    15 Downloads (Pure)

  • PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory

    Fieback, M., Münch, C., Gebregiorgis, A., Cardoso Medeiros, G., Taouil, M., Hamdioui, S. & Tahoori, M., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-6 6 p. 9810436

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    88 Downloads (Pure)

  • Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes

    Masoumian, S., Selimis, G., Wang, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, p. 1189-1192 4 p. 9774735

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    2 Citations (Scopus)
    39 Downloads (Pure)

  • Smart Redundancy Schemes for ANNs against Fault Attacks

    Köylü, T. Ç., Hamdioui, S. & Taouil, M., 2022, Proceedings of the 2022 IEEE European Test Symposium (ETS). Danvers: IEEE, p. 1-2 2 p. 9810380

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    1 Citation (Scopus)
    43 Downloads (Pure)

  • Structured Test Development Approach for Computation-in-Memory Architectures

    Fieback, M., Taouil, M. & Hamdioui, S., 2022, Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia). Ceballos, C. (ed.). Piscataway: IEEE, p. 61-66 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    1 Citation (Scopus)
    9 Downloads (Pure)

  • Using Hopfield Networks to Correct Instruction Faults

    Köylü, T. C., Fieback, M., Hamdioui, S. & Taouil, M., 2022, 2022 IEEE 31st Asian Test Symposium (ATS). IEEE, p. 102-107 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    35 Downloads (Pure)
  • 2023

    A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks

    Aljuffri, A., Saxena, M., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2023, Proceedings of the 2023 26th Euromicro Conference on Digital System Design (DSD). Niar, S., Ouarnoughi, H. & Skavhaug, A. (eds.). Piscataway: IEEE, p. 87-94 8 p. (Proceedings - 2023 26th Euromicro Conference on Digital System Design, DSD 2023).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Characterization and Test of Intermittent Over RESET in RRAMs

    Xun, H., Fieback, M., Yuan, S., Aziza, H., Heidekamp, M., Copetti, T., Poehls, L. B., Taouil, M. & Hamdioui, S., 2023, Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS). Piscataway: IEEE, 6 p. (Asian Test Symposium Proceedings).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review