Research output per year
Research output per year
Personal profile
Education/Academic qualification
Doctorate, RRAM, Computer Engineering
Award Date: 8 Jul 2022
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Dive into the research topics where M.C.R. Fieback is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
Copetti, T. S., Fieback, M., Gemmeke, T., Hamdioui, S. & Poehls, L. M. B., 2024, In: Journal of Electronic Testing: Theory and Applications (JETTA). 40, 2, p. 245-257 13 p.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile65 Downloads (Pure) -
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing
Aziza, H., Postel-Pellerin, J., Fieback, M., Hamdioui, S., Xun, H., Taouil, M., Coulie, K. & Rahajandraibe, W., 2024, 2024 IEEE 25th Latin American Test Symposium (LATS). IEEE, 5 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open AccessFile -
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs
Copetti, T. S., Chordia, A., Fieback, M., Taouil, M., Hamdioui, S. & Bolzani Poehls, L. M., 2024, 2024 IEEE 25th Latin American Test Symposium, LATS 2024. IEEE, (2024 IEEE 25th Latin American Test Symposium, LATS 2024).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Design-for-Test for Intermittent Faults in STT-MRAMs
Yuan, S., Yaldagard, M. A., Xun, H., Fieback, M., Marinissen, E. J., Kim, W., Rao, S., Couet, S., Taouil, M. & Hamdioui, S., 2024, 2024 IEEE European Test Symposium (ETS). 6 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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Device-Aware Diagnosis for Yield Learning in RRAMs
Xun, H., Fieback, M., Yuan, S., Aziza, H., Taouil, M. & Hamdioui, S., 2024, 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings. IEEE, 6 p. (Proceedings -Design, Automation and Test in Europe, DATE).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Prizes
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ETS 2021 Best Paper Award
Fieback, M.C.R. (Recipient), Cardoso Medeiros, G. (Recipient), Gebregiorgis, A.B. (Recipient), Aziza, Hassen (Recipient), Taouil, M. (Recipient) & Hamdioui, S. (Recipient), May 2022
Prize: Prize (including medals and awards)
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LATS 2018 Best Paper Award
Fieback, M.C.R. (Recipient), Taouil, M. (Recipient), Hamdioui, S. (Recipient) & Rovatti, Marco (Recipient), 2018
Prize: Prize (including medals and awards)
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LATS 2022 Best Paper Award
Copetti, Thiago (Recipient), Nilovic, Max (Recipient), Fieback, M.C.R. (Recipient), Gemmeke, T. (Recipient), Hamdioui, S. (Recipient) & Poehls, Leticia Bolzani (Recipient), 2023
Prize: Prize (including medals and awards)