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Research Output

Abstract

Energy Spread Measurement of an Electron Impact Gas Ion Source Equipped with a Miniaturized Gas Chamber

Jun, DS. & Kruit, P., 2013, p. 1-2. 2 p.

Research output: Contribution to conferenceAbstractScientific

1 Downloads (Pure)
Article

100 Volumes of Ultramicroscopy

Kruit, P., 2004, In : Ultramicroscopy. 1-2, p. xi-xiv

Research output: Contribution to journalArticleScientificpeer-review

10 nm lines and spaces written in HSQ using electron beam lithography

Grigorescu, AE., van der Krogt, MC., Hagen, CW. & Kruit, P., 2007, In : Microelectronic Engineering. 84, p. 822-824 3 p.

Research output: Contribution to journalArticleScientificpeer-review

75 Citations (Scopus)

Aberration model of a multi beam scanning microscope for electron beam-induced deposition

van Bruggen, MJ., van Someren, B. & Kruit, P., 2006, In : Scanning: the journal of scanning microscopies. 28, 1, p. 42-47 6 p.

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

A combined objective lens for electrons and ions

Jager, PWH., Kelder, MCW. & Kruit, P., 1996, In : Microelectronic Engineering. 30, p. 427-430 4 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Addition of different contributions to the charged particle probe size

Barth, JE. & Kruit, P., 1996, In : Optik. 101, 3, p. 101-109 9 p.

Research output: Contribution to journalArticleScientificpeer-review

139 Citations (Scopus)
4 Citations (Scopus)

A high-current scanning electron microscope with multi-beam optics

Doi, T., Yamazaki, M., Ichimura, T., Ren, Y. & Kruit, P., 2016, In : Microelectronic Engineering. 159, p. 132-138 7 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

A large current scanning electron microscope with MEMS-based multi-beam optics

Ichimura, T., Ren, Y. & Kruit, P., 2013, In : Microelectronic Engineering. 113, p. 109-113 5 p.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
8 Citations (Scopus)

A large current scanning electron microscope with MEMS-based multi-beam optics

Ichimura, T., Ren, Y. & Kruit, P., 2014, In : Microelectronic Engineering. 113, p. 109-113 5 p.

Research output: Contribution to journalArticleScientificpeer-review

8 Citations (Scopus)

An experimental setup to test the MAPPER electron lithography concept.

Kampherbeek, BJ., Wieland, MJJ., Zuuk, A. & Kruit, P., 2000, In : Microelectronic Engineering. 53, 1-4, p. 279-282 4 p.

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)

A noval vacuum electron source based on ballistic electron emission

Borgonjen, EG., van Bakel, GPEM., Hagen, CW. & Kruit, P., 1997, In : Applied Surface Science. 111, p. 165-169 5 p.

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)

Approaching the resolution limit of nanometer-scale electron beam-induced deposition

van Dorp, WF., van Someren, B., Hagen, CW., Kruit, P. & A. Crozier, P., 2005, In : Nano Letters: a journal dedicated to nanoscience and nanotechnology. 5, 7, p. 1303-1307 5 p.

Research output: Contribution to journalArticleScientificpeer-review

223 Citations (Scopus)

A simple fabrication method for tunnel junction emitters.

van Aken, RH., Janssen, MAPM., Hagen, CW. & Kruit, P., 2001, In : Solid-State Electronics. 45, p. 1033-1038 6 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

A study of the reproducibility of electron beam induced deposition for sub-20 nm lithography

Hari, S., Verduin, T., Kruit, P. & Hagen, C. W., 2019, In : Micro and Nano Engineering. 4, p. 1-6

Research output: Contribution to journalArticleScientificpeer-review

Open Access
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1 Citation (Scopus)
71 Downloads (Pure)

A testing set-up for a micro-analysis positron beam facility

Jorgensen, LV., van Veen, A., Schut, H., Winkelman, AJM. & Kruit, P., 1999, In : Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment. 427, p. 131-135 5 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

A testing set-up for a micro-analysis positron beam facility.

Jorgensen, LV., van Veen, AHV., Schut, H., Winkelman, AJM. & Kruit, P., 1999, In : Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment. 427, p. 131-135 5 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Augerspectroscopie met Hoge Plaatsresolutie in een Elekronenmicroscoop

Hoevers, HFC., Faber, JS. & Kruit, P., 1997, In : Nederlands Tijdschrift voor Natuurkunde. 63, 10, p. 257-259 3 p.

Research output: Contribution to journalArticleProfessional

Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers

Haring, M., Liv Hamarat, N., Zonnevylle, C., Narvaez Gonzalez, A., Voortman, L., Kruit, P. & Hoogenboom, J., 2 Mar 2017, In : Scientific Reports. 7, 43621.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
File
11 Citations (Scopus)
31 Downloads (Pure)

Beam displacement and blur caused by fast electron beam deflection

Zhang, L., Garming, M. W. H., Hoogenboom, J. P. & Kruit, P., 2020, In : Ultramicroscopy. 211, 7 p., 112925.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
File
5 Downloads (Pure)

Brightness limitations of cold field emitters caused by Coulomb interactions

Cook, BJ., Verduin, T., Hagen, CW. & Kruit, P., 2010, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 28, C6C74, p. 1-6 6 p.

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)

Brightness measurements of a Gallium liquid metal ion source

Hagen, CW., Fokkema, E. & Kruit, P., 2008, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 26, 6, p. 2091-2096 6 p.

Research output: Contribution to journalArticleScientificpeer-review

19 Citations (Scopus)

Brightness measurements of a ZrO/W Schottky electron emitter in a Transmission Electron Microscope.

Fransen, MF., Overwijk, MHF. & Kruit, P., 1999, In : Applied Surface Science. 146, p. 357-362 6 p.

Research output: Contribution to journalArticleScientificpeer-review

21 Citations (Scopus)

Brightness measurements of the nano-aperture ion source

Van Kouwen, L. & Kruit, P., 2018, In : Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 36, 6, 06J901.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
File
2 Citations (Scopus)
54 Downloads (Pure)

Calculation of the electron-optical characteristics of electron beams transmitted into vacuum from a sharp tip-thin foil junction

van Bakel, GPEM., Borgonjen, EG., Hagen, CW. & Kruit, P., 1998, In : Journal of Applied Physics. 83, 8, p. 4279-4285 7 p.

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)

Cathode Ray tube type electron gun as a source for multibeam electron lithography

van den Brom, AJ., van Veen, AHV., Weeda, WM., Berglund, GZM., Wieland, M. J. J. & Kruit, P., 2007, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 25, 6, p. 2245-2249 5 p.

Research output: Contribution to journalArticleScientificpeer-review

9 Citations (Scopus)

Cathodoluminescence Microscopy of nanostructures on glass substrates

Narvaez, AC., Weppelman, IGC., Moerland, RJ., Liv, N., Zonnevylle, AC., Kruit, P. & Hoogenboom, JP., 2013, In : Optics Express. 21, 24, p. 29968-29978 11 p.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
9 Citations (Scopus)

Characterization of ultrasharp field emitters by projection microscopy

Fransen, MJ., Damen, EPN., Schiller, C., van Rooy, TL., Groen, HB. & Kruit, P., 1996, In : Applied Surface Science. 94/95, p. 107-112 6 p.

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)

'Collapsing rings' on Schottky electron emitters

Bronsgeest, MS. & Kruit, P., 2010, In : Ultramicroscopy. 110, 9, p. 1243-1254 12 p.

Research output: Contribution to journalArticleScientificpeer-review

8 Citations (Scopus)
9 Citations (Scopus)

Comparison between different imaging modes in focussed ion beam instruments

Jiang, XR. & Kruit, P., 1996, In : Microelectronic Engineering. 30, p. 249-252 4 p.

Research output: Contribution to journalArticleScientificpeer-review

18 Citations (Scopus)
Open Access
File
11 Citations (Scopus)
26 Downloads (Pure)

Concept and operation of Schottky emitter without suppressor electrode

Dokania, AK. & Kruit, P., 2009, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 27, 6, p. 2426-2431 6 p.

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)

Confocal filtering in cathodoluminescence microscopy of nanostructures

Narvaez Gonzalez, AC., Weppelman, IGC., Moerland, RJ., Hoogenboom, JP. & Kruit, P., 2014, In : Applied Physics Letters. 104, 251121 (2014), p. 1-5 5 p.

Research output: Contribution to journalArticleScientificpeer-review

8 Citations (Scopus)

Construction and characterization of the fringe field monochromator for a field emission gun.

Mook, HW. & Kruit, P., 2000, In : Ultramicroscopy. 81, 3/4, p. 129-139 11 p.

Research output: Contribution to journalArticleScientificpeer-review

59 Citations (Scopus)

Coulomb interactions in sharp tip pulsed photo field emitters

Cook, B. & Kruit, P., 10 Oct 2016, In : Applied Physics Letters. 109, 15, 151901.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
File
7 Citations (Scopus)
40 Downloads (Pure)
Open Access
3 Citations (Scopus)

Design and fabrication of a miniaturized gas ionization chamber for production of high quality ion beams

Jun, DS., Kutchoukov, VG., Heerkens, CTH. & Kruit, P., 2012, In : Microelectronic Engineering. 97, p. 134-137 4 p.

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Design and simulation of a linear electron cavity for quantum electron microscopy

Turchetti, M., Kim, C. S., Hobbs, R., Yang, Y., Kruit, P. & Berggren, K. K., 2019, In : Ultramicroscopy. 199, p. 50-61

Research output: Contribution to journalArticleScientificpeer-review

Design Approach for a Multi Beam Electron Beam Induced Deposition System

van Someren, B., van Bruggen, MJ. & Kruit, P., 2005, In : Scanning: the journal of scanning microscopies. 27, 2, p. 107-108 2 p.

Research output: Contribution to journalArticleScientificpeer-review

Design for an aberration corrected scanning electron microscope using miniature electron mirrors

Dohi, H. & Kruit, P., 1 Jun 2018, In : Ultramicroscopy. 189, p. 1-23 23 p.

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Design of an aberration corrected low-voltage SEM

van Aken, RH., Maas, D. J., Hagen, CW., Barth, JE. & Kruit, P., 2010, In : Ultramicroscopy. 110, 11, p. 1411-1419 9 p.

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Designs for a quantum electron microscope

Kruit, P., Hobbs, R. G., Kim, C. S., Yang, Y., Manfrinato, V. R., Hammer, J., Thomas, S., Weber, P., Klopfer, B., Kohstall, C., Juffmann, T., Kasevich, M. A., Hommelhoff, P. & Berggren, K. K., 1 May 2016, In : Ultramicroscopy. 164, p. 31-45 15 p.

Research output: Contribution to journalArticleScientificpeer-review

32 Citations (Scopus)

Determination of line edge roughness in low-dose top-down scanning electron microscopy images

Verduin, T., Kruit, P. & Hagen, CW., 2014, In : Journal of Micro/Nanolithography, MEMS, and MOEMS. 13, 3, p. 1-10 10 p.

Research output: Contribution to journalArticleScientificpeer-review

Development of a multi electron beam source for sub-10 nm electron beam induced deposition

van Bruggen, MJ., van Someren, B. & Kruit, P., 2005, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 23, 6, p. 2833-2839 7 p.

Research output: Contribution to journalArticleScientificpeer-review

22 Citations (Scopus)

Differential phase contrast in TEM

McCartney, MR., Kruit, P., Buist, AH. & Scheinfein, MR., 1996, In : Ultramicroscopy. 65, p. 179-186 8 p.

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)

Diffraction patterns of artificial 2-d crystals synthesized in sItu in an environmental scanning transmission electron microscope

van Dorp, WF., van Someren, B., Hagen, CW., Kruit, P. & A. Crozier, P., 2006, In : Journal of Microscopy. pt 3 March, 2006, p. 159-163 5 p.

Research output: Contribution to journalArticleScientificpeer-review

Directed assembly of nano particles with the help of charge patterns created with scanning electron microscope

Zonnevylle, AC., Hagen, CW., Kruit, P. & Schmidt-Ott, A., 2009, In : Microelectronic Engineering. 86, 4-6, p. 803-805 3 p.

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)