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Research Output

2000

Intrinsic high-brightness monochromatic electron sources for microscopy.

van Aken, RH., Kreyveld, M., van Druten, NJ., Hagen, CW. & Kruit, P., 2000, Jaarboek Nederlandse Vereniging voor Microscopie. p. 128-129 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Limits to the reduced brightness of the Zr/O/W Schottky emitter.

van Veen, AHV., Barth, JE., Hagen, CW. & Kruit, P., 2000, Jaarboek Nederlandse Vereniging voor Microscopie. p. 188-189 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Monochromator for high brightness electron guns.

Mook, HW., Batson, PE. & Kruit, P., 2000, Proceedings 12th European congress on electron microscopy. p. 315-316 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Nanospleten.

Mook, HW. & Kruit, P., 2000, IPC No. Aangevraagd in 1998., Patent No. 1009959, Priority date 29 Feb 2000

Research output: Patent

Optimisation of the short field monochromator configuration for a high brightness electron source.

Mook, HW. & Kruit, P., 2000, In : Optik. 111, 8, p. 339-346 8 p.

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)

Proposal for patent application.

Kruit, P., 2000, Delft: Delft University of Technology. 4 p.

Research output: Book/ReportReportProfessional

Resolution limits in Electron Beam Induced Deposition (EBID).

Silvis-Cividjian, N., Hagen, CW. & Kruit, P., 2000, Jaarboek Nederlandse Vereniging voor Microscopie. p. 184-185 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Resolution of the multiple aperture pixel by pixel enhancement of resolution electron lithography concept.

Kampherbeek, BJ., Wieland, MJJ. & Kruit, P., 2000, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 18, 1, p. 117-121 5 p.

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)

Retrofit of an Emispec data acquisition system for Auger spectroscopy and coincidence measurements in a TEM.

van Es, JJP., Nonhebel, J. & Kruit, P., 2000, Jaarboek Nederlandse Vereniging voor Microscopie. p. 148-149 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

SCALPEL feasibility study.

Kruit, P., Bleeker, AJ. & Jager, PWH., 2000, Delft: Delft University of Technology. 60 p.

Research output: Book/ReportReportProfessional

SCALPEL Gun test station experiments & initial improvement modeling, Interim status report #3

van Kranen, SR., Moonen, D., Nijkerk, MD. & Kruit, P., 2000, Onbek.: Onbek. 28 p.

Research output: Book/ReportReportProfessional

SEM resolution improvement at low voltage with gun monochromator.

Barth, JE., Nijkerk, MD., Mook, HW. & Kruit, P., 2000, Proceedings 12 th European congress on electron microscopy. p. 437-438 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

The introduction of monochromators in electron microscope guns.

Kruit, P. & Mook, HW., 2000, In : Dianzi Xianwei Xuebao: Journal Chinese Electron Microscopy Society. 19, 2, p. 113-118 6 p.

Research output: Contribution to journalArticleScientificpeer-review

Theory and measurements of the Zr/O/W Schottky emitter.

van Veen, AHV., Barth, JE., Hagen, CW. & Kruit, P., 2000, Delft: Delft University of Technology. 123 p.

Research output: Book/ReportReportProfessional

1999
4 Citations (Scopus)

An experimental setup to proof the MAPPER electron lithography concept.

Kampherbeek, BJ., Wieland, MJJ. & Kruit, P., 1999, Abstractbook EIPBN'99.. p. 239-240 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

An experimental setup to prove the MAPPER electron lithography concept.

Kampherbeek, BJ., Wieland, MJJ. & Kruit, P., 1999, Abstractbook Micro-and-Nano-Engineering 99.. p. 19-20 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

An experimental setup to test the Mapper electron lithography concept.

Kampherbeek, BJ., Wieland, MJJ., Zuuk, A. & Kruit, P., 1999, Proceedings International Conference on Micro- & Nano-Engineering 1999.. Gentili, M. (ed.). p. 19-20 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Assessment of learning results in a problem-based physics course.

de Graaff, E. & Kruit, P., 1999, Proceedings SEFI Delft.. p. 47-52 6 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

A testing set-up for a micro-analysis positron beam facility

Jorgensen, LV., van Veen, A., Schut, H., Winkelman, AJM. & Kruit, P., 1999, In : Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment. 427, p. 131-135 5 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

A testing set-up for a micro-analysis positron beam facility.

Jorgensen, LV., van Veen, AHV., Schut, H., Winkelman, AJM. & Kruit, P., 1999, In : Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment. 427, p. 131-135 5 p.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Brightness measurements of a ZrO/W Schottky electron emitter in a Transmission Electron Microscope.

Fransen, MF., Overwijk, MHF. & Kruit, P., 1999, In : Applied Surface Science. 146, p. 357-362 6 p.

Research output: Contribution to journalArticleScientificpeer-review

21 Citations (Scopus)

Electron Spectroscopy in the STEM.

Kruit, P., 1999, Proceedings of International Eighth Beijing Conference and exhibition on instrumental analyses.. Beijing: Peking University Press, p. -

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Energy filtering of Schottky field emission gun using fringe field monochromator.

Mook, HW., van Veen, AHV. & Kruit, P., 1999, Proceedings Microscopy & Microanalysis 1999.. p. -

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Enhancing student motivation in applied physics by means of a pbl module.

de Graaff, E. & Kruit, P., 1999, Research and Development in Problem Based Learning: A Way Forward. Conway, J., Williams, A. & Melville, D. (eds.). Australian Problem Based Learning Network, p. 83-87 280 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Field emission energy distribution form individual multi-walled carbon nanotubes.

Fransen, MF., van Rooy, TL. & Kruit, P., 1999, In : Applied Surface Science. 146, p. 312-327 16 p.

Research output: Contribution to journalArticleScientificpeer-review

217 Citations (Scopus)

Fringe Field Monochromator (Wien Filter)

Mook, HW. & Kruit, P., 1999, Patent No. 1007902, Priority date 25 Jun 1999

Research output: Patent

Gun Test Station Assembly. Initial Modeling Results.

Moonen, D., Nijkerk, MD. & Kruit, P., 1999, Delft: Delft University of Technology. 18 p.

Research output: Book/ReportReportProfessional

Illumination system for electron beam lithography tool.

Katsap, V., Waskiewicz, WK., Moonen, D. & Kruit, P., 1999, IPC No. Oktober 1999, Patent No. 1199987, Priority date 1 Jan 1800

Research output: Patent

Investigation of illumination non-uniformities from an electron gun for projection electron-beam lithography.

Moonen, D., Nijkerk, MD., Kruit, P. & Waskiewicz, WK., 1999, Abstractbook EIPBN'99.. p. 250-251 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Mapper concept, a hybrid deep-UV and electron projection lithography system for the 0.1 mm.

Kruit, P., 1999, IPC No. Aangevraagd in 1998., Patent No. PCT/NL/98/00297, Priority date 1 Jan 1800

Research output: Patent

Nanospleten.

Mook, HW. & Kruit, P., 1999, IPC No. in 1998, Patent No. 1009959, Priority date 1 Jan 1800

Research output: Patent

Off-axis holography with a crystal beam splitter.

Mertens, BM., Overwijk, MHF. & Kruit, P., 1999, In : Ultramicroscopy. 77, p. 1-11 11 p.

Research output: Contribution to journalArticleScientificpeer-review

9 Citations (Scopus)

On the electron-optical properties of the ZrO/W Schottky electron emitter.

Fransen, MF., van Rooy, TL., Tiemeijer, PC., Overwijk, MHF., Faber, JS. & Kruit, P., 1999, In : Advances in Imaging and Electron Physics. 111, p. 91-166 76 p.

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)

On the Monochromatisation of High Brightness Electron Sources for electron Microscopy.

Mook, HW. & Kruit, P., 1999, In : Ultramicroscopy. 78, p. 43-51 9 p.

Research output: Contribution to journalArticleScientificpeer-review

25 Citations (Scopus)

Operation of the Fringe Field Monochromator in Field Emission STEM.

Mook, HW., Batson, PE. & Kruit, P., 1999, Proceedings Electron Microscopy and Analysis 1999.. Institute of Physics Conference Series., p. 223-226 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Proposal for patent application.

Kruit, P., 1999, Delft: Delft University of Technology. 4 p.

Research output: Book/ReportReportProfessional

Resolution improvement in Low Voltage SEM with FEG monochromator.

Mook, HW., Barth, JE. & Kruit, P., 1999, Delft: Delft University of Technology. 17 p.

Research output: Book/ReportReportProfessional

Results of a pilot experiment on direct phase determination of diffracted beams in TEM.

Mertens, BM. & Kruit, P., 1999, Proceedings Electron Microscopy and Analysis 1999.. Institute of Physics Conference Series., p. 133-136 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

The Fringe Field Monochromator in a Field Emission STEM.

Mook, HW., van Veen, AHV. & Kruit, P., 1999, Jaarboek 1999, Nederlandse Vereniging voor Microscopie.. p. 90-91 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Through-the-lens Auger SEM with the SNOR as spectrometer input lens.

Kruit, P. & Lencova, B., 1999, Delft: Delft University of Technology. 24 p.

Research output: Book/ReportReportProfessional

Uniform illumination in SCALPEL by imaging the angular distribution.

Moonen, D., Nijkerk, MD., Kruit, P. & Waskiewicz, WK., 1999, Proceedings of SPIE's 44th Annual Meeting, Charged Particle Optics IV.. Munro, E. (ed.). p. 7-14 8 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

1998

Analysis and Improvement of the SCALPEL Source, Initial Project Plan TNDO 98-55

Moonen, D., Nijkerk, MD. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 5 p.

Research output: Book/ReportReportProfessional

Brightness measurements of a Zr/W Schottky electron emitter in a Transmission Electron Microscope

Fransen, MJ., Overwijk, MHF. & Kruit, P., 1998, International Vacuum Electron Sources Conference (IVESC). p. 163-164 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Calculation of the electron-optical characteristics of electron beams transmitted into vacuum from a sharp tip-thin foil junction

van Bakel, GPEM., Borgonjen, EG., Hagen, CW. & Kruit, P., 1998, In : Journal of Applied Physics. 83, 8, p. 4279-4285 7 p.

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)

Design of the SCALPEL Gun Test Station, Interum status report #1 TNDO 98-52

Moonen, D., Nijkerk, MD. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 22 p.

Research output: Book/ReportReportProfessional

Experimental evaluation of the extended-Schottky model for ZrO/W electron emission

Fransen, MJ., Faber, JS., van Rooy, TL., Tiemeijer, PC. & Kruit, P., 1998, In : Journal of Vacuum Science and Technology. Part B: Microelectronics and Nanometer Structures. 16, 4, p. 2063-2072 10 p.

Research output: Contribution to journalArticleScientificpeer-review

28 Citations (Scopus)

Field emission energy distribution from individual multi-walled carbon nanotubes

Fransen, MJ., van Rooy, TL. & Kruit, P., 1998, International Vacuum Electron Sources Conference (IVESC). p. 11-12 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Finge Field Monochromator for high brightness electron sources

Mook, HW. & Kruit, P., 1998, Proceedings of the 14th International Congress on Electron Microscopy. p. 73-74 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific