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Research Output

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2001

Aberations of the electron optical systemof MAPPER

van Veen, AHV. & Kruit, P., 2001, s.l.: s.n. 26 p.

Research output: Book/ReportReportProfessional

Design of the electron optical part of the mapper machine.

Jager, R. & Kruit, P., 2001, s.l.: s.n. 30 p.

Research output: Book/ReportReportProfessional

Measurement report on sample w 109 k 15

Teepen, TF., van Veen, AHV. & Kruit, P., 2001, s.l.: s.n. 11 p.

Research output: Book/ReportReportProfessional

Simple model on the spectal response of the Field Emission Photocathode.

van Veen, AHV. & Kruit, P., 2001, Onbek.: Onbek. 13 p.

Research output: Book/ReportReportProfessional

2000

Afsluitbare aperture houder voor transmissie electronen microscopen.

van Harrewijn, P., van der Heijden, HTC. & Kruit, P., 2000, Delft: Delft University of Technology. 24 p.

Research output: Book/ReportReportProfessional

Coincidence electron spectroscopy with nanometer scale resolution.

Kruit, P., 2000, Delft: Delft University of Technology. 5 p.

Research output: Book/ReportReportProfessional

Gun test station experiments & install improvements, Interim status report #4

van Kranen, SR., Moonen, D., Nijkerk, MD. & Kruit, P., 2000, s.l.: s.n. 50 p.

Research output: Book/ReportReportProfessional

Gun test station experiments & install improvements II, Interim status report #5

van Kranen, SR., Moonen, D., Nijkerk, MD. & Kruit, P., 2000, s.l.: s.n. 26 p.

Research output: Book/ReportReportProfessional

Proposal for patent application.

Kruit, P., 2000, Delft: Delft University of Technology. 4 p.

Research output: Book/ReportReportProfessional

SCALPEL feasibility study.

Kruit, P., Bleeker, AJ. & Jager, PWH., 2000, Delft: Delft University of Technology. 60 p.

Research output: Book/ReportReportProfessional

SCALPEL Gun test station experiments & initial improvement modeling, Interim status report #3

van Kranen, SR., Moonen, D., Nijkerk, MD. & Kruit, P., 2000, Onbek.: Onbek. 28 p.

Research output: Book/ReportReportProfessional

Theory and measurements of the Zr/O/W Schottky emitter.

van Veen, AHV., Barth, JE., Hagen, CW. & Kruit, P., 2000, Delft: Delft University of Technology. 123 p.

Research output: Book/ReportReportProfessional

1999

Gun Test Station Assembly. Initial Modeling Results.

Moonen, D., Nijkerk, MD. & Kruit, P., 1999, Delft: Delft University of Technology. 18 p.

Research output: Book/ReportReportProfessional

Proposal for patent application.

Kruit, P., 1999, Delft: Delft University of Technology. 4 p.

Research output: Book/ReportReportProfessional

Resolution improvement in Low Voltage SEM with FEG monochromator.

Mook, HW., Barth, JE. & Kruit, P., 1999, Delft: Delft University of Technology. 17 p.

Research output: Book/ReportReportProfessional

Through-the-lens Auger SEM with the SNOR as spectrometer input lens.

Kruit, P. & Lencova, B., 1999, Delft: Delft University of Technology. 24 p.

Research output: Book/ReportReportProfessional

1998

Analysis and Improvement of the SCALPEL Source, Initial Project Plan TNDO 98-55

Moonen, D., Nijkerk, MD. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 5 p.

Research output: Book/ReportReportProfessional

Design of the SCALPEL Gun Test Station, Interum status report #1 TNDO 98-52

Moonen, D., Nijkerk, MD. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 22 p.

Research output: Book/ReportReportProfessional

Ontwikkeling Rotating Anode Tube fase 2 TN-DO 98-58

Koets, E. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 17 p.

Research output: Book/ReportReportProfessional

Optimum operation of the High Resolution EELS monochromator TNDO 98-14

Mook, HW. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 32 p.

Research output: Book/ReportReportProfessional

Through-the-lens Auger-SEM with the parallelizer principle TNDO 98-53

Lencova, B. & Kruit, P., 1998, Delft: Technische Universiteit Delft. 57 p.

Research output: Book/ReportReportProfessional

1997

Auger spectroscopy in SNOR-SEM, system concept

Kruit, P. & Lencova, B., 1997, Delft: Technische Universiteit Delft. 15 p.

Research output: Book/ReportReportProfessional

Extrapolation of the Coulomb interaction blur reduction due to spherical aberration to the axis

Kruit, P. & Barth, JE., 1997, Delft: Technische Universiteit Delft. 5 p.

Research output: Book/ReportReportProfessional

Feasibility study for a high brightness X-ray source of 1 micro-meter focal spot diameter

Mulder, EH., Barth, JE., Hagen, CW. & Kruit, P., 1997, Delft: Techische Universiteit Delft. 60 p.

Research output: Book/ReportReportProfessional

Ontwikkeling Rotating Anode Tube fase 2

Koets, E. & Kruit, P., 1997, Delft: Technische Universiteit Delft. 17 p.

Research output: Book/ReportReportProfessional

1996

Coulomb interactions in the Philips XL-FEG

Barth, JE., Xiang, XR., Nijkerk, MD., Jansen, GH. & Kruit, P., 1996, Delft: Technische Universiteit Delft. 32 p.

Research output: Book/ReportReportProfessional

Electron Standing Wave Illumination For Electron Microscopy, Review of the work performed and results

Kruit, P. & Mertens, BM., 1996, Delft: Technische Universiteit Delft. 15 p.

Research output: Book/ReportReportProfessional

Ontwikkeling Rataring Anode Tube fase 0+1

van der Stam, MAJ., Koets, E. & Kruit, P., 1996, Delft: Technische Universiteit Delft. 27 p.

Research output: Book/ReportReportProfessional

Throughput in ion beam projection lithography

Barth, JE. & Kruit, P., 1996, Delft: Technische Universiteit Delft. 21 p.

Research output: Book/ReportReportProfessional