Hofmeyer, J.,
Stewart, D.,
Berger, HS.,
Eydt, BC.,
Frantz, F.,
Granelli, F.,
Kontson, K.,
Murotake, D.,
Nolan, K.,
Pawelczak, P.,
Venkatesha Prasad, RR.,
Roy, R.,
Scoville, M.,
Sicker, D.,
Swain, D. &
Tenhula, P.,
2008, New York, NY:
IEEE Society.
48 p.Research output: Book/Report › Book › Scientific