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Research Output

Assessing the impact of a highly-cited paper

Alkemade, P., 2019, 17th International Conference on Scientometrics and Informetrics, ISSI 2019 - Proceedings. Catalano, G., Daraio, C., Gregori, M., Moed, H. F. & Ruocco, G. (eds.). International Society for Scientometrics and Informetrics, Vol. 2. p. 1894-1899

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • 3D Volumetric Energy Deposition of Focused Helium Ion Beam Lithography: Visualization, Modeling, and Applications in Nanofabrication

    Cai, J., Zhu, Z., Alkemade, P. F. A., van Veldhoven, E., Wang, Q., Ge, H., Rodrigues, S. P., Cai, W. & Li, W. D., 22 Jun 2018, In : Advanced Materials Interfaces. 5, 12, 8 p., 1800203.

    Research output: Contribution to journalArticleScientificpeer-review

  • 2 Citations (Scopus)

    Advanced defect classification by smart sampling, based on sub-wavelength anisotropic scatterometry

    Van Der Walle, P., Kramer, E., Ebeling, R., Spruit, H., Alkemade, P., Pereira, S., Van Der Donck, J. & Maas, D., 2018, Metrology, Inspection, and Process Control for Microlithography XXXII. Ukraintsev, V. A. & Adan, O. (eds.). SPIE, Vol. 10585. 105852D

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

  • Controlling supercurrents and their spatial distribution in ferromagnets

    Lahabi, K., Amundsen, M., Ouassou, J. A., Beukers, E., Pleijster, M., Linder, J., Alkemade, P. & Aarts, J., 1 Dec 2017, In : Nature Communications. 8, 1, 2056.

    Research output: Contribution to journalArticleScientificpeer-review

    Open Access
    File
  • 6 Citations (Scopus)
    35 Downloads (Pure)

    Deep sub-wavelength metrology for advanced defect classification

    van der Walle, P., Kramer, E., van der Donck, J. C. J., Mulckhuyse, W., Nijsten, L., Bernal Arango, F. A., de Jong, A., van Zeijl, E., Spruit, H. E. T., van Den Berg, J. H., Nanda, G., Van Langen-Suurling, A. K., Alkemade, P. F. A., Pereira, S. F. & Maas, D. J., 2017, Optical Measurement Systems for Industrial Inspection X. Lehmann, P., Osten, W. & Albertazzi Gonçalves, A. (eds.). Bellingham, WA, USA: SPIE, 10 p. 103294N. (Proceedings of SPIE; vol. 10329).

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    File
  • 4 Citations (Scopus)
    48 Downloads (Pure)

    Activities

    • 4 Talk or presentation at a workshop, seminar, course or other meeting

    EBSD on lift out specimens

    P.F.A. Alkemade (Speaker)

    6 Oct 2003 → …

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting

    Application of the dual beam focussed ion beam for material research

    P.F.A. Alkemade (Speaker)

    22 May 2003 → …

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting

    Application of the dual beam focused ion beam for crystallography

    P.F.A. Alkemade (Speaker)

    4 Apr 2003 → …

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting

    Application of the focused ion beam for crystallography

    P.F.A. Alkemade (Speaker)

    22 May 2003 → …

    Activity: Talk or presentationTalk or presentation at a workshop, seminar, course or other meeting