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S. Hamdioui

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 https://orcid.org/0000-0002-8961-0387
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  • 2020

    A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    20 Downloads (Pure)

  • A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE , p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    3 Citations (Scopus)
    73 Downloads (Pure)

  • Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2020, Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019. Bilof, R. S. (ed.). Piscataway: IEEE , Vol. 2019-December. p. 129-134 6 p. 8949396. (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    7 Citations (Scopus)
    377 Downloads (Pure)

  • Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs

    Augusto da Silva, F., Bagbaba, A. C., Sartoni, S., Cantoro, R., Reorda, M. S., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE , p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    6 Citations (Scopus)
    92 Downloads (Pure)

  • Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    1 Citation (Scopus)
    51 Downloads (Pure)

  • Efficient organization of digital periphery to support integer datatype for memristor-based cim

    Zahedi, M., Mayahinia, M., Abu Lebdeh, M., Wong, S. & Hamdioui, S., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE , p. 216-221 6 p. 9154923. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    98 Downloads (Pure)

  • ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

    Copetti, T., Medeiros, G. C., Taouil, M., Hamdioui, S., Poehls, L. B. & Balen, T., 1 Mar 2020, 21st IEEE Latin-American Test Symposium, LATS 2020. Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9093667

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    5 Citations (Scopus)
    29 Downloads (Pure)

  • Exploiting Approximate Computing for implementing Low Cost Fault Tolerance Mechanisms

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Institute of Electrical and Electronics Engineers (IEEE), 2 p. 9081268

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    2 Citations (Scopus)
    92 Downloads (Pure)

  • G-PUF: An Intrinsic PUF Based on GPU Error Signatures

    Forlin, B., Husemann, R., Carro, L., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE , p. 1-2 2 p. 9131562

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Guard-NoC: A protection against side-channel attacks for MPSoCs

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M., Forlin, B. E. & Sepulveda, J., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Pisacataway: IEEE , p. 536-541 6 p. 9154989. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    3 Citations (Scopus)
    72 Downloads (Pure)

  • LiD-CAT: A Lightweight Detector for Cache ATtacks

    Reinbrecht, C., Hamdioui, S., Taouil, M., Niazmand, B., Ghasempouri, T., Raik, J. & Sepulveda, J., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE , p. 1-6 6 p. 9131603

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    66 Downloads (Pure)

  • Mitigation of Sense Amplifier Degradation Using Skewed Design

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1614-1617 4 p. 9116532. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Modeling Static Noise Margin for FinFET based SRAM PUFs

    Masoumian, S., Selimis, G., Maes, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE , p. 1-6 6 p. 9131583

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    3 Citations (Scopus)
    145 Downloads (Pure)

  • N-bit Data Parallel Spin Wave Logic Gate

    Mahmoud, A. N. N., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). IEEE , p. 642-645 4 p. 9116368

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    10 Citations (Scopus)
    43 Downloads (Pure)

  • On the Analysis of Real-time Operating System Reliability in Embedded Systems

    Mamone, D., Bosio, A., Savino, A., Hamdioui, S. & Rebaudengo, M., 2020, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. Dilillo, L., Psarakis, M. & Siddiqua, T. (eds.). IEEE , p. 1-6 6 p. 9250861. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    109 Downloads (Pure)

  • RNN-based Detection of Fault Attacks on RSA

    Köylü, T. C., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE , p. 1-5 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    81 Downloads (Pure)

  • S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX

    Aljuffri, A., Venkatachalam, P., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, Embedded Computer Systems: Architectures, Modeling, and Simulation - 20th International Conference, SAMOS 2020, Proceedings. Orailoglu, A., Jung, M. & Reichenbach, M. (eds.). Springer Science+Business Media, p. 295-307 13 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 12471 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Special Session: AutoSoC: A Suite of Open-Source Automotive SoC Benchmarks

    Augusto da Silva, F., Bagbaba, A. C., Ruospo, A., Mariani, R., Kanawati, G., Reorda, M. S., Jenihhin, M., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE 38th VLSI Test Symposium (VTS): Proceedings. IEEE , p. 1-9 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    5 Citations (Scopus)
    251 Downloads (Pure)

  • Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

    Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE , Vol. 2020-April. 9107595. (Proceedings of the IEEE VLSI Test Symposium; vol. 2020-April).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    7 Citations (Scopus)

  • Testing Scouting Logic-Based Computation-in-Memory Architectures

    Fieback, M., Nagarajan, S., Bishnoi, R., Tahoori, M., Taouil, M. & Hamdioui, S., 2020, Proceedings - 2020 IEEE European Test Symposium, ETS 2020: Proceedings. IEEE , p. 1-6 6 p. 9131604. (Proceedings of the European Test Workshop; vol. 2020-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • The Power of Computation-in-Memory Based on Memristive Devices

    Yu, J., Abu Lebdeh, M., Du Nguyen, H. A., Taouil, M. & Hamdioui, S., 15 Jan 2020, 25th Asia and South Pacific Design Automation Conference (ASP-DAC). IEEE , p. 385-392 8 p. 9045162

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    4 Citations (Scopus)
    88 Downloads (Pure)

  • Yield Estimation of a Memristive Sensor Array

    Gupta, V., Khandelwal, S., Panunzi, G., Martinelli, E., Hamdioui, S., Jabir, A. & Ottavi, M., 2020, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS): Proceedings. IEEE , p. 1-2 2 p. 9159727

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)
  • 2019

    A Computation-In-Memory Accelerator Based on Resistive Devices

    Du Nguyen, H. A., Yu, J., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, Proceedings of the International Symposium on Memory Systems. New York: Association for Computing Machinery (ACM), p. 19-32 14 p. (ICPS: ACM International Conference Proceeding Series).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)
    2 Downloads (Pure)

  • Applications of Computation-In-Memory Architectures based on Memristive Devices

    Hamdioui, S., Du Nguyen, H. A., Taouil, M., Sebastian, A., Le Gallo, M., Pande, S., Schaafsma, S., Catthoor, F., Das, S., G. Redondo, F., Karunaratne, G., Rahimi, A. & Benini, L., 2019, Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019: Proceedings. IEEE , p. 486-491 6 p. 8715020

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    30 Citations (Scopus)
    930 Downloads (Pure)

  • CIM-SIM: Computation in Memory SIMuIator

    Banagozar, A., Vadivel, K., Stuijk, S., Corporaal, H., Wong, S., Lebdeh, M. A., Yu, J. & Hamdioui, S., 27 May 2019, SCOPES'19: Proceedings of the 22nd International Workshop on Software and Compilers for Embedded Systems. Stuijk, S. (ed.). New York, NY: Association for Computing Machinery (ACM), p. 1-4 4 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    10 Citations (Scopus)

  • Device-Aware Test: A New Test Approach Towards DPPB Level

    Fieback, M., Wu, L., Cardoso Medeiros, G., Aziza, H., Rao, S., Marinissen, E. J., Taouil, M. & Hamdioui, S., 9 Nov 2019, 2019 IEEE International Test Conference, ITC 2019. IEEE , 10 p. 9000134. (Proceedings - International Test Conference; vol. 2019-November).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    27 Citations (Scopus)
    93 Downloads (Pure)

  • DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

    Cardoso Medeiros, G., Taouil, M., Fieback, M., Bolzani Poehls, L. M. & Hamdioui, S., 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019: Proceedings. IEEE , Vol. 2019-May. p. 1-2 2 p. 8791517

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    6 Citations (Scopus)
    145 Downloads (Pure)

  • Efficient Methodology for ISO26262 Functional Safety Verification

    Silva, F. A. D., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 1 Jul 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). Piscataway: IEEE , p. 255-256 2 p. 8854449. (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    2 Citations (Scopus)
    84 Downloads (Pure)

  • Hardware-based aging mitigation scheme for memory address decoder

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 IEEE European Test Symposium (ETS). IEEE , p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    48 Downloads (Pure)

  • Memristive Device Based Circuits for Computation-in-Memory Architectures

    Lebdeh, M. A., Reinsalu, U., Du Nguyen, H. A., Wong, S. & Hamdioui, S., 1 May 2019, 2019 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway, NJ: IEEE , p. 1-5 5 p. 8702542

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    209 Downloads (Pure)

  • Memristive device modeling and circuit design exploration for computation-in-memory

    Siemon, A., Wouters, D., Hamdioui, S. & Menzel, S., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), Vol. 2019-May. 8702600

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    13 Citations (Scopus)

  • Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE , p. 162-167 6 p. 8715143

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE , p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    12 Citations (Scopus)

  • Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE , p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE , p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    4 Citations (Scopus)
    72 Downloads (Pure)

  • Testing Computation-in-Memory Architectures Based on Emerging Memories

    Hamdioui, S., Fieback, M., Nagarajan, S. & Taouil, M., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE , 10 p. 9000117

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    69 Downloads (Pure)

  • Time-division Multiplexing Automata Processor

    Yu, J., Du Nguyen, H. A., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) : Proceedings. IEEE , p. 794-799 6 p. 8715140

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    210 Downloads (Pure)

  • Untestable faults identification in GPGPUs for safety-critical applications

    Condia, J. E. R., Da Silva, F. A., Hamdioui, S., Sauer, C. & Reorda, M. S., 2019, 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019. Institute of Electrical and Electronics Engineers (IEEE), p. 570-573 4 p. 8964677. (2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    57 Downloads (Pure)
  • 2018

    Degradation analysis of high performance 14nm FinFET SRAM

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 1 Mar 2018, 2018 Design, Automation Test in Europe Conference Exhibition (DATE). p. 201-206 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    10 Citations (Scopus)

  • Device aging: A reliability and security concern

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Catthoor, F., Chatterjee, A., Singh, A., Wunderlich, H. & Karimi, N., 1 May 2018, 2018 IEEE 23rd European Test Symposium (ETS). p. 1-10 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Electrical Modeling of STT-MRAM Defects

    Wu, L., Taouil, M., Rao, S., Marinissen, E. J. & Hamdioui, S., 2018, International Test Conference - Proceedings. Piscataway, NJ: IEEE , p. 1-10 10 p. 3.2

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    8 Citations (Scopus)
    40 Downloads (Pure)

  • Ionizing radiation modeling in DRAM transistors

    Fieback, M., Taouil, M., Hamdioui, S. & Rovatti, M., 2018, 2018 IEEE 19th Latin-American Test Symposium, LATS 2018. IEEE , Vol. 2018-January. p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Memristive devices for computation-in-memory

    Yu, J., Du Nguyen, H. A., Xie, L., Taouil, M. & Hamdioui, S., 2018, Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE , p. 1646-1651 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    29 Citations (Scopus)
    59 Downloads (Pure)

  • Testing Resistive Memories: Where Are We and What Is Missing?

    Fieback, M., Taouil, M. & Hamdioui, S., 2018, International Test Conference 2018 - Proceedings. Piscataway, NJ: IEEE , p. 1-9 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Use of Formal Methods for verification and optimization of Fault Lists in the scope of ISO26262

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2018, DVCon Europe 2018. p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

    Open Access
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    253 Downloads (Pure)
  • 2017

    Interconnect Networks for Resistive Computing Architectures

    Du Nguyen, H. A., Xie, L., Yu, J., Taouil, M. & Hamdioui, S., 2017, 2017 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS). Danvers: IEEE , p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Memristive devices: Technology, design automation and computing frontiers

    Barbareschi, M., Bosio, A., Du Nguyen, H. A., Hamdioui, S., Traiola, M. & Vatajelu, E. I., 2017, 2017 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS). Danvers: IEEE , p. 1-8 8 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Memristor For Computing: Myth or Reality?

    Hamdioui, S., Kvatinsky, S., Cauwenberghs, G., Xie, L., Wald, N., Joshi, S., Elsayed, H. M., Corporaal, H. & Bertels, K., 2017, Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE , p. 722-731 10 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    71 Citations (Scopus)

  • Mitigation of sense amplifier degradation using input switching

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., Catthoor, F. & Dehaene, W., 2017, Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE , p. 858-863 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    16 Citations (Scopus)