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S. Hamdioui

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 https://orcid.org/0000-0002-8961-0387
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  • 2019

    Hardware-based aging mitigation scheme for memory address decoder

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 IEEE European Test Symposium (ETS). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    7 Citations (Scopus)
    65 Downloads (Pure)

  • Memristive Device Based Circuits for Computation-in-Memory Architectures

    Lebdeh, M. A., Reinsalu, U., Du Nguyen, H. A., Wong, S. & Hamdioui, S., 1 May 2019, 2019 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway, NJ: IEEE, p. 1-5 5 p. 8702542

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    12 Citations (Scopus)
    260 Downloads (Pure)

  • Memristive device modeling and circuit design exploration for computation-in-memory

    Siemon, A., Wouters, D., Hamdioui, S. & Menzel, S., 2019, 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings. Institute of Electrical and Electronics Engineers (IEEE), Vol. 2019-May. 8702600

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    16 Citations (Scopus)

  • Methodology for Application-Dependent Degradation Analysis of Memory Timing

    Kraak, D., Agbo, I., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. IEEE, p. 162-167 6 p. 8715143

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

    Wu, L., Rao, S., Cardoso Medeiros, G., Taouil, M., Marinissen, E. J., Yasin, F., Couet, S., Hamdioui, S. & Kar, G. S., 2019, 2019 IEEE European Test Symposium (ETS): Proceedings. Danvers: IEEE, p. 1-6 6 p. 8791518

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    15 Citations (Scopus)

  • Rebooting Computing: The Challenges for Test and Reliability

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K., Vatajelu, E. I., di Natale, G., Anghel, L., Nagarajan, S., Fieback, M. C. R. & Hamdioui, S., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    8 Citations (Scopus)

  • Software-Based Mitigation for Memory Address Decoder Aging

    Kraak, D., Gursoy, C. C., Agbo, I. O., Taouil, M., Jenihhin, M., Raik, J. & Hamdioui, S., 2019, 2019 IEEE Latin American Test Symposium (LATS). Danvers: IEEE, p. 1-6 6 p. 8704595

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    4 Citations (Scopus)
    106 Downloads (Pure)

  • Testing Computation-in-Memory Architectures Based on Emerging Memories

    Hamdioui, S., Fieback, M., Nagarajan, S. & Taouil, M., 9 Nov 2019, 2019 IEEE International Test Conference (ITC). IEEE, 10 p. 9000117

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    13 Citations (Scopus)
    175 Downloads (Pure)

  • Time-division Multiplexing Automata Processor

    Yu, J., Du Nguyen, H. A., Abu Lebdeh, M., Taouil, M. & Hamdioui, S., 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) : Proceedings. IEEE, p. 794-799 6 p. 8715140

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    234 Downloads (Pure)

  • Untestable faults identification in GPGPUs for safety-critical applications

    Condia, J. E. R., Da Silva, F. A., Hamdioui, S., Sauer, C. & Reorda, M. S., 2019, 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019. Institute of Electrical and Electronics Engineers (IEEE), p. 570-573 4 p. 8964677. (2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    3 Citations (Scopus)
    76 Downloads (Pure)
  • 2020

    2-output spin wave programmable logic gate

    Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Cotofana, S. & Hamdioui, S., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 60-65 6 p. 9155012. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    11 Citations (Scopus)
    125 Downloads (Pure)

  • 4-output Programmable Spin Wave Logic Gate

    Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Hamdioui, S. & Cotofana, S., 2020, 2020 IEEE 38th International Conference on Computer Design (ICCD): Proceedings. Guerrero, J. (ed.). Piscataway: IEEE, p. 332-335 4 p. 9283535. (2020 IEEE 38TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    9 Citations (Scopus)
    69 Downloads (Pure)

  • A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

    Medeiros, G. C., Cem Gursoy, C., Wu, L., Fieback, M., Jenihhin, M., Taouil, M. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 792-797 6 p. 9116278. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    40 Downloads (Pure)

  • A Security Verification Template to Assess Cache Architecture Vulnerabilities

    Ghasempouri, T., Raik, J., Paul, K., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Proceedings. IEEE, p. 1-6 6 p. 9095707

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    101 Downloads (Pure)

  • Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2020, Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019. Bilof, R. S. (ed.). Piscataway: IEEE, Vol. 2019-December. p. 129-134 6 p. 8949396. (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    9 Citations (Scopus)
    548 Downloads (Pure)

  • Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs

    Augusto da Silva, F., Bagbaba, A. C., Sartoni, S., Cantoro, R., Reorda, M. S., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    200 Downloads (Pure)

  • Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

    Wu, L., Fieback, M., Taouil, M. & Hamdioui, S., 2020, 2020 IEEE European Test Symposium (ETS). Institute of Electrical and Electronics Engineers (IEEE), p. 1-2 2 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    89 Downloads (Pure)

  • Efficient organization of digital periphery to support integer datatype for memristor-based cim

    Zahedi, M., Mayahinia, M., Abu Lebdeh, M., Wong, S. & Hamdioui, S., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Piscataway: IEEE, p. 216-221 6 p. 9154923. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    9 Citations (Scopus)
    149 Downloads (Pure)

  • ESRAM Reliability: Why is it still not optimally solved?

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9081145

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

    Copetti, T., Medeiros, G. C., Taouil, M., Hamdioui, S., Poehls, L. B. & Balen, T., 1 Mar 2020, 21st IEEE Latin-American Test Symposium, LATS 2020. Institute of Electrical and Electronics Engineers (IEEE), 6 p. 9093667

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    6 Citations (Scopus)
    54 Downloads (Pure)

  • Exploiting Approximate Computing for implementing Low Cost Fault Tolerance Mechanisms

    Bosio, A., O'Connor, I., Rodrigues, G. S., Lima, F. K. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. Institute of Electrical and Electronics Engineers (IEEE), 2 p. 9081268

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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    3 Citations (Scopus)
    128 Downloads (Pure)

  • G-PUF: An Intrinsic PUF Based on GPU Error Signatures

    Forlin, B., Husemann, R., Carro, L., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-2 2 p. 9131562

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Guard-NoC: A protection against side-channel attacks for MPSoCs

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M., Forlin, B. E. & Sepulveda, J., 2020, 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Proceedings. O'Conner, L. (ed.). Pisacataway: IEEE, p. 536-541 6 p. 9154989. (2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020)).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    134 Downloads (Pure)

  • Impact of Magnetic Coupling and Density on STT-MRAM Performance

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Grenoble, France: IEEE, p. 1211-1216 6 p. 9116444

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    44 Downloads (Pure)

  • LiD-CAT: A Lightweight Detector for Cache ATtacks

    Reinbrecht, C., Hamdioui, S., Taouil, M., Niazmand, B., Ghasempouri, T., Raik, J. & Sepulveda, J., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131603

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    107 Downloads (Pure)

  • Mitigation of Sense Amplifier Degradation Using Skewed Design

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S. & Catthoor, F., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers (IEEE), p. 1614-1617 4 p. 9116532. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Modeling Static Noise Margin for FinFET based SRAM PUFs

    Masoumian, S., Selimis, G., Maes, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE, p. 1-6 6 p. 9131583

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    237 Downloads (Pure)

  • N-bit Data Parallel Spin Wave Logic Gate

    Mahmoud, A. N. N., Vanderveken, F., Ciubotaru, F., Adelmann, C., Cotofana, S. & Hamdioui, S., 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE): Proceedings. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). IEEE, p. 642-645 4 p. 9116368

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    11 Citations (Scopus)
    60 Downloads (Pure)

  • On the Analysis of Real-time Operating System Reliability in Embedded Systems

    Mamone, D., Bosio, A., Savino, A., Hamdioui, S. & Rebaudengo, M., 2020, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. Dilillo, L., Psarakis, M. & Siddiqua, T. (eds.). IEEE, p. 1-6 6 p. 9250861. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    8 Citations (Scopus)
    252 Downloads (Pure)

  • RNN-based Detection of Fault Attacks on RSA

    Köylü, T. C., Reinbrecht, C. R. W., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS). Piscataway: IEEE, p. 1-5 5 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    145 Downloads (Pure)

  • S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX

    Aljuffri, A., Venkatachalam, P., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2020, Embedded Computer Systems: Architectures, Modeling, and Simulation - 20th International Conference, SAMOS 2020, Proceedings. Orailoglu, A., Jung, M. & Reichenbach, M. (eds.). Springer, p. 295-307 13 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 12471 LNCS).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    2 Citations (Scopus)

  • Special Session: AutoSoC: A Suite of Open-Source Automotive SoC Benchmarks

    Augusto da Silva, F., Bagbaba, A. C., Ruospo, A., Mariani, R., Kanawati, G., Reorda, M. S., Jenihhin, M., Hamdioui, S. & Sauer, C., 2020, 2020 IEEE 38th VLSI Test Symposium (VTS): Proceedings. IEEE, p. 1-9 9 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    420 Downloads (Pure)

  • Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

    Bishnoi, R., Wu, L., Fieback, M., Munch, C., Nair, S. M., Tahoori, M., Wang, Y., Li, H. & Hamdioui, S., 1 Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE, Vol. 2020-April. 9107595. (Proceedings of the IEEE VLSI Test Symposium; vol. 2020-April).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    9 Citations (Scopus)

  • Testing Scouting Logic-Based Computation-in-Memory Architectures

    Fieback, M., Nagarajan, S., Bishnoi, R., Tahoori, M., Taouil, M. & Hamdioui, S., 2020, Proceedings - 2020 IEEE European Test Symposium, ETS 2020: Proceedings. IEEE, p. 1-6 6 p. 9131604. (Proceedings of the European Test Workshop; vol. 2020-May).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    12 Citations (Scopus)

  • The Power of Computation-in-Memory Based on Memristive Devices

    Yu, J., Abu Lebdeh, M., Du Nguyen, H. A., Taouil, M. & Hamdioui, S., 15 Jan 2020, 25th Asia and South Pacific Design Automation Conference (ASP-DAC). IEEE, p. 385-392 8 p. 9045162

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    122 Downloads (Pure)

  • Yield Estimation of a Memristive Sensor Array

    Gupta, V., Khandelwal, S., Panunzi, G., Martinelli, E., Hamdioui, S., Jabir, A. & Ottavi, M., 2020, 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS): Proceedings. IEEE, p. 1-2 2 p. 9159727

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)
  • 2021

    Achieving Wave Pipelining in Spin Wave Technology

    Mahmoud, A., Vanderveken, F., Adelmann, C., Ciubotaru, F., Hamdioui, S. & Cotofana, S., 2021, Proceedings of the 22nd International Symposium on Quality Electronic Design, ISQED 2021. Piscataway: IEEE, p. 54-59 6 p. 9424264. (Proceedings - International Symposium on Quality Electronic Design, ISQED; vol. 2021-April).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    5 Citations (Scopus)
    32 Downloads (Pure)

  • An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2021, Proceedings - 2021 IEEE International Test Conference, ITC 2021: Proceedings. Bilof, R. S. (ed.). Piscataway: IEEE, p. 329-333 5 p. 9611308. (Proceedings - International Test Conference).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

  • Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2021, 2020 IEEE International Test Conference, ITC 2020. IEEE, p. 1-10 10 p. 9325258. (Proceedings - International Test Conference; vol. 2020-November).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    7 Citations (Scopus)
    139 Downloads (Pure)

  • Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM

    Wu, L., Rao, S., Taouil, M., Marinissen, E. J., Kar, G. S. & Hamdioui, S., 2021, Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021. IEEE, p. 1717-1722 6 p. 9473999. (Proceedings -Design, Automation and Test in Europe, DATE; vol. 2021-February).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    4 Citations (Scopus)
    87 Downloads (Pure)

  • Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation

    Aziza, H., Hamdioui, S., Fieback, M., Taouil, M. & Moreau, M., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 1877-1880 4 p. 9473967

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    6 Citations (Scopus)

  • Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

    Cardoso Medeiros, G., Fieback, M., Gebregiorgis, A., Taouil, M., Bolzani Poehls, L. & Hamdioui, S., 2021, 2021 IEEE European Test Symposium (ETS). Danvers: IEEE, 6 p. 9465441

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    65 Downloads (Pure)

  • Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks

    Köylü, T. C., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 18th International Conference on Privacy, Security and Trust (PST). Piscataway: IEEE, p. 1-10 10 p. (2021 18th International Conference on Privacy, Security and Trust, PST 2021).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    1 Citation (Scopus)
    24 Downloads (Pure)

  • Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*

    Bosio, A., O'Connor, I., Traiola, M., Echavarria, J., Teich, J., Hanif, M. A., Shafique, M., Hamdioui, S., Deveautour, B., Girard, P., Virazel, A. & Bertels, K., 2021, 2021 IEEE European Test Symposium (ETS). Danvers: IEEE, 10 p. 9465409

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    5 Citations (Scopus)

  • Evaluating the Impact of Process Variation on RRAMs

    Brum, E., Fieback, M., Copetti, T. S., Jiayi, H., Hamdioui, S., Vargas, F. & Bolzani Poehls, L. M., 2021, 2021 IEEE 22nd Latin American Test Symposium, LATS 2021: Proceedings. Danvers: IEEE, p. 1-6 6 p. 9651789. (2021 IEEE 22nd Latin American Test Symposium, LATS 2021).

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    4 Citations (Scopus)

  • Fan-out of 2 Triangle Shape Spin Wave Logic Gates

    Mahmoud, A., Adelmann, C., Vanderveken, F., Cotofana, S., Ciubotaru, F. & Hamdioui, S., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 948-953 6 p. 9474089

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    4 Citations (Scopus)
    22 Downloads (Pure)

  • Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S. & Sauer, C., 2021, 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS). Danvers: IEEE, p. 1-7 7 p. 9486697

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • GRINCH: A Cache Attack against GIFT Lightweight Cipher

    Reinbrecht, C., Aljuffri, A., Hamdioui, S., Taouil, M. & Sepulveda, J., 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE). Piscataway: IEEE, p. 549-554 6 p. 9474201

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    3 Citations (Scopus)

  • Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks

    Aljuffri, A. A. M., Reinbrecht, C., Hamdioui, S. & Taouil, M., 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    1 Citation (Scopus)

  • Improving the Detection of Undefined State Faults in FinFET SRAMs

    Cardoso Medeiros, G., Fieback, M., Copetti, T., Gebregiorgis, A. B., Taouil, M., Bolzani Poehls, L. M. & Hamdioui, S., 2021, International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS). 16th ed. IEEE, 6 p.

    Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

    Open Access
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    48 Downloads (Pure)