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  • Modeling Static Noise Margin for FinFET based SRAM PUFs

    Masoumian, S., Selimis, G., Maes, R., Schrijen, G-J., Hamdioui, S. & Taouil, M., 2020, 2020 IEEE European Test Symposium (ETS): Proceedings. IEEE , p. 1-6 6 p. 9131583

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Open Access
    1 Citation (Scopus)
    68 Downloads (Pure)