Research output per year
Research output per year
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Research output
- 1 Conference contribution
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Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs
Yuan, S., Zhang, Z., Fieback, M., Xun, H., Marinissen, E. J., Kar, G. S., Rao, S., Couet, S., Taouil, M. & Hamdioui, S., 2023, Proceedings - 2023 IEEE International Test Conference, ITC 2023. IEEE, p. 236-245 10 p. (Proceedings - International Test Conference).Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
Open AccessFile1 Citation (Scopus)5 Downloads (Pure)