S.G.M. Heirman - TU Delft Research Portal

3 Patent
1 Article

Geometrically and spectrally resolved albedometers for bifacial modules
Pandraud, G., Zeman, M., Isabella, O., Ziar, H. & Heirman, S. G. M., 2023, IPC No. G01J, G01W, Patent No. US 11835385, Priority date 12 Feb 2020
Research output: Patent
Geometrically and spectrally resolved albedometers for bifacial modules
Pandraud, G., Zeman, M., Isabella, O., Ziar, H. & Heirman, S. G. M., 2021, IPC No. G01J, G01W, Priority date 12 Feb 2020, Priority No. WO2021/162544
Research output: Patent
Fourier optical measurement system (FOMS)
Fischer, M., Melskens, J., Heirman, SGM. & Elshinawy, MAA., 2015, Patent No. WO 2015/080579, Priority date 4 Jun 2015
Research output: Patent
In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy
Melskens, J., Schouten, M., Santbergen, R., Fischer, M., Vasudevan, RA., van der Vlies, DJ., Quax, RJV., Heirman, SGM., Jaeger, K., Demontis, V., Zeman, M. & Smets, AHM., 2014, In: Solar Energy Materials & Solar Cells. 129, p. 70-81 12 p.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access

25 Citations (Scopus)