19982016

Research output per year

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Research Output

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Conference contribution
2016

A novel mixing surface acoustic wave device for liquid sensing applications

Bui, T. H., Morana, B., Scholtes, T., Chu Duc, T. & Sarro, L., 2016, 2016 IEEE 29th International Conference Micro Electro Mechanical Systems (MEMS). Piscataway, NJ: IEEE, p. 745-748 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2015

SAW device for liquid vaporization rate and remaining molecule sensing

Bui, TH., Morana, B., Tran, AT., Scholtes, TLM., Chu Duc, T. & Sarro, PM., 2015, Proceedings of the 2015 IEEE SENSORS. Tadigadapa, S. & Lee, J. (eds.). Piscataway: IEEE Society, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
2 Citations (Scopus)
2013

A simple model describing the kinetic of CVD deposition of pure-boron layers from diborane

Mohammadi, V., De Boer, WB., Scholtes, TLM. & Nanver, LK., 2013, Proceedings - Symposium on Thermal and Plasma CVD of Nanostructures and their Applications - 221st ECS Meeting. Fergus et al, JW. (ed.). Pennington: Electrochemical Society, p. 57-65 9 p. (ECS Transactions; vol. 45).

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
4 Citations (Scopus)

Reverse biasing and breakdown behavior of PureB diodes

Qi, L., Mok, KRC., Aminian, M., Scholtes, TLM., Charbon, E. & Nanver, LK., 2013, Extended abstracts of the 13th International Workshop on Junction Technology. Tsutsui, K., Li, Z. & Mizushima, I. (eds.). Tokyo, Japan: JSAP, p. 70-73 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
1 Citation (Scopus)

UV-sensitive low dark-count PureB single-photon avalanche diode

Qi, L., Mok Kai Rine, C., Scholtes, TLM., Aminian, M., Charbon, E. & Nanver, LK., 2013, Proceedings IEEE Sensors 2013. Trew, R. & Brown, E. (eds.). Piscataway, NJ, USA: IEEE Society, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
10 Citations (Scopus)
2012

Epitaxial growth of large-area p+n diodes at 400 ºC by aluminum-induced crystallization

Sakic, A., Qi, L., Scholtes, TLM., van der Cingel, J. & Nanver, LK., 2012, Proc. of the 42th European Solid-State Device Research Conference (ESSDERC 2012). Bordeaux: IEEE Society, p. 145-148 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
1 Citation (Scopus)

Pure dopant deposition of B and Ga for ultrashallow junctions in Si-based devices

Nanver, LK., Sammak, A., Mohammadi, V., Mok, KRC., Qi, L., Sakic, A., Golshani, N., Derakhshandeh, J., Scholtes, TLM. & De Boer, WB., 2012, 27th Symposium on Microelectronics Technology and Devices. p. 25-33 9 p. (ECS Transactions; vol. 49).

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
15 Citations (Scopus)
2011

On the uniformity of pure-boron-layer depositions

Mohammadi, V., de Boer, WD., Scholtes, TLM., Sakic, A., Heerkens, C. T. H. & Nanver, LK., 2011, ICT.OPEN: Micro technology and micro devices (SAFE 2011). Smeulders, A., van der Drift, R., Karelse, F. & Stroobandt, D. (eds.). Veldhoven, The Netherlands: STW, p. 73-75 3 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Solid-state backscattered-electron detector for sub-keV imaging in scanning electron microscopy

Sakic, A., Nanver, LK., van Veen, G., Kooijman, K., Vogelsang, P., Scholtes, TLM., de Boer, W., Wien, WHA., Milosavljevic, S., Heerkens, C. T. H., Knezevic, T. & Spee, I., 2011, ICT.OPEN: Micro technology and micro devices (SAFE 2011). Smeulders, A., van den Drift, R., Karelse, F. & Stroobandt, D. (eds.). Veldhoven, The Netherlands: STW, p. 92-95 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2010

Characterization of amorphous boron layers as diffusion barrier for pure aluminium

Sakic, A., Jovanovic, V., Maleki, P., Scholtes, TLM., Milosavljevic, S. & Nanver, LK., 2010, 2010 Proceedings of the 33rd International Convention MIPRO. Biljanovic et al, P. (ed.). Rijeka, Croatia: MIPRO, p. 26-29 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

13 Citations (Scopus)

Deep p+ junctions formed by drive-in from pure boron depositions

Maleki, P., Scholtes, TLM., Popadic, M., Sarubbi, F., Lorito, G., Milosavljevic, S., De Boer, WB. & Nanver, LK., 2010, Extended abstracts 2010 International Workshop on Junction Technology (IWJT). Yu, LJ., Xin, PQ., Guo, PR. & Bing, ZL. (eds.). Los Alamitos, CA, USA: IEEE Society, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
4 Citations (Scopus)

Pure boron chemical vapor deposited layers; A new material for silicon device processing

Nanver, LK., Scholtes, TLM., Sarubbi, F., De Boer, WB., Lorito, G., Sakic, A., Milosavljevic, S., Mok Kai Rine, C., Shi, L., Nihtianov, S. & Buisman, K., 2010, Proceedings 18th IEEE Conference on Advanced Thermal Processing of Semiconductors - RTP 2010. Lojek et al, B. (ed.). Piscataway, NJ, USA: IEEE Society, p. 136-139 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Open Access
14 Citations (Scopus)

Silicon photodiodes for high-efficiency low-energy electron detection

Sakic, A., Nanver, LK., Scholtes, TLM., Heerkens, CTH., van Veen, G., Kooijman, K. & Vogelsang, P., 2010, Proceedings of IEEE 40th European Solid-State Device Research Conference (ESSDERC 2010). Huertas Diaz et al, JL. (ed.). Piscataway, NJ, USA: IEEE Society, p. 102-105 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

8 Citations (Scopus)

The influence of stacking faults on the leakage current of b-layer p+n diodes

Golshani, N., De Boer, WB., Scholtes, TLM., Sakic, A. & Nanver, LK., 2010, Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010. French et al, P. (ed.). Utrecht, The Netherlands: STW, p. 81-84 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Ultrashallow junction silicon photodiodes for detection of low energy electrons

Sakic, A., Nanver, LK., Scholtes, TLM., Heerkens, CTH., van Veen, G., Kooijman, K. & Vogelsang, P., 2010, Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010. French et al, P. (ed.). Utrecht, The Netherlands: STW, p. 150-153 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

Sakic, A., Nanver, LK., van Veen, G., Kooijman, K., Vogelsang, P., Scholtes, TLM., De Boer, WB., Wien, WHA., Milosavljevic, S., Heerkens, CTH., Knezevic, T. & Spee, I., 2010, Proceedings 2010 IEEE International Electron Devices Meeting (IEDM). S.N. (ed.). Piscataway, NJ, USA: IEEE Society, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

14 Citations (Scopus)
2009

Application of amorphous boron layer as diffusion barrier for pure aluminium

Sakic, A., Lorito, G., Sarubbi, F., Scholtes, TLM., van der Cingel, J. & Nanver, LK., 2009, Proc. of SAFE 2009. French, PJ. (ed.). Veldhoven, the Netherlands: STW, p. 112-115 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionProfessional

high performance silicon based extreme ultraviolet radiation detector for industrial application

Shi, L., Sarubbi, F., Nihtianov, S., Nanver, LK., Scholtes, TLM. & Scholze, F., 2009, high performance silicon based extreme ultraviolet radiation detector for industrial application. s.n. (ed.). porto, portugal: IEEE Society, p. 1891-1896 6 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
2008

Extremely ultrashallow junctions for a high-linearity silicon-on-glass RF varactor-diode technology

Nanver, LK., Sarubbi, F., Gonda, V., Popadic, M., Scholtes, TLM., De Boer, WB. & Buisman, K., 2008, IEEE international workshop on junction technology. Jiang, YL., Qu, XP., Ru, GP. & Li, BZ. (eds.). s.l.: IEEE Society, p. 101-106 6 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Extremely ultra-shallow p+-n boron-deposited silicon diodes applied to DUV photodiodes

Sarubbi, F., Nanver, LK., Scholtes, TLM. & Nihtianov, S., 2008, 66th annual device research conference. Appenzeller, J. (ed.). s.l.: IEEE Society, p. 143-144 2 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

13 Citations (Scopus)

High-performance DUV/EUV photodiodes in a pure boron doping technology

Sarubbi, F., Nanver, LK., Scholtes, TLM., Nihtianov, S. & Scholze, F., 2008, The annual workshop on semiconductor advances for future electronics and sensors. s.n. (ed.). Veldhoven, the Netherlands: STW, p. 588-591 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Pure boron-doped photodiodes: a solution for radiation detection in EUV lithography

Sarubbi, F., Nanver, LK., Scholtes, TLM., Nihtianov, S. & Scholze, F., 2008, IEEE 38th european solid-state device research conference. Hall, S. (ed.). s.l.: IEEE Society, p. 278-281 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

34 Citations (Scopus)

RF/microwave device fabrication in silicon-on-glass technology

Nanver, LK., Schellevis, H., Scholtes, TLM., La Spina, L., Lorito, G., Sarubbi, F., Gonda, V., Popadic, M., Buisman, K., de Vreede, LCN., Huang, C., Milosavljevic, S. & Goudena, EJG., 2008, Proc. 26th international conference on microelectronics. Stojadinovic, N. (ed.). Nis, Serbia: IEEE Society, p. 273-280 8 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

SiGe HBTs implemented with implanted laser-annealed emitters to completely eliminate the transient enhanced diffusion

Lorito, G., Gonda, V., Scholtes, TLM. & Nanver, LK., 2008, Proc. 26th international conference on microelectronics. Stojadinovic, N. (ed.). s.l.: s.n., p. 291-294 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)

Special RF/microwave devices in silicon-on-glass technology

Nanver, LK., Scholtes, TLM., La Spina, L., Lorito, G., Sarubbi, F., Gonda, V., Popadic, M., Buisman, K., de Vreede, LCN., Huang, C., Milosavljevic, S. & Goudena, EJG., 2008, IEEE 2008 bipolar/BiCMOS circuits and technology meeting. Bafleur, M. (ed.). s.l.: IEEE Society, p. 33-40 8 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)

Ultra-low-temperature process modules for back-wafer-contacted silicon-on-glass RF/microwave technology

Nanver, LK., Gonda, V., Civale, Y., Scholtes, TLM., La Spina, L., Schellevis, H., Lorito, G., Sarubbi, F., Popadic, M., Buisman, K., Milosavljevic, S. & Goudena, EJG., 2008, Proc. 9th international conference on solid-state and integrated circuit technology. Tang, T-A., Ru, H., Min, Y. & Xia, A. (eds.). s.l.: ICSICT, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2007

Integration of a ¿hands-on¿ research training course in a high-discipline IC-processing research cleanroom

Milosavljevi¿, S., Schellevis, H., van Bogaard, A., Scholtes, TLM., Laros, JMW., de Boer, CR., Goudena, EJG. & Nanver, LK., 2007, 2nd International Conference on Engineering Education& Training. s.l. (ed.). Kuwait: s.n., p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Profile Engineering of Decreasing Arsenic Doping in Silicon RPCVD

Popadic, M., Sarubbi, F., Scholtes, TLM., Milosavljevic, S., de Boer, W. & Nanver, LK., 2007, SAFE 2007 Semiconductor advances for future electornics. s.n. (ed.). s.l.: STW, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Study of boron-doped nm-deep junctions fabricated by B2H6 surface reaction doping

Sarubbi, F., Nanver, LK. & Scholtes, TLM., 2007, SAFE 2007 Semiconductor advances for future electornics. s.n. (ed.). s.l.: STW, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Ultra-Shallow Dopant Diffusion from Pre-deposited RPCVD Monolayers of Arsenic and Phosphorus

Popadic, M., Nanver, LK. & Scholtes, TLM., 2007, Proc. IEEE RTP 2007. s.n. (ed.). Catania, Italy: IEEE Society, p. 1-4 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2006

CVD delta-doped boron surface layers for ultra-shallow junction formation

Sarubbi, F., Nanver, LK. & Scholtes, TLM., 2006, Electrochemical Society Transactions, Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 2: New Materials, Processes, and Equipment. Roozeboom, F. (ed.). Cancun, Mexico: Electrochemical Society, p. 35-44 10 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

22 Citations (Scopus)

Degradation of Diode Junction Characteristics due to Residual Defects Caused by Laser-Annealed Implantations Studied by Bipolar Test Structures

Gonda, V., Scholtes, TLM. & Nanver, LK., 2006, Proceedings of 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. s.n. (ed.). Veldhoven, The Netherlands: s.l., p. 423-426 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Electrical Characterization of Residual Bulk Defects after Laser Annealing of Implanted Shallow Junctions

Liu, S., Gonda, V., Scholtes, TLM. & Nanver, LK., 2006, Proc. IEEE International Workshop on Junctions Technology. s.n. (ed.). Shanghai, China: Electron Device Society, p. 112-115 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

Electrical Characterization of Residual Implantation-Induced Defects in the Vicinity of Laser-Annealed Implanted Ultrashallow Junctions in Doping Engineering for Device Fabrication

Gonda, V., Liu, S., Scholtes, TLM. & Nanver, LK., 2006, Material Research Society Symposium Proceedings (912, Warrendale, PA). Pawlak, BJ. (ed.). San Francisco, USA: Material Research Society, p. -

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Profile Engineering of Decreasing Arsenic Doping in Silicon RPCVD

Popadic, M., Sarubbi, F., Scholtes, TLM., Milosavljevic, S., De Boer, WB. & Nanver, LK., 2006, Proceedings of 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. s.n (ed.). Veldhoven, The Netherlands: s.l., p. 475-478 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Reliability issues related to laser-annealed implanted back-wafer contacts in bipolar silicon-on-glass processes

Lorito, G., Gonda, V., Liu, S., Scholtes, TLM., Schellevis, H. & Nanver, LK., 2006, Proc. IEEE International Conference on Microelectronics. s.n. (ed.). Belgrade, Serbia: Electron Device Society, p. 369-372 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)

Schottky barrier height modulation by ultra-shallow low-dose dopant diffusion

Popadic, M., Nanver, LK. & Scholtes, TLM., 2006, 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings. s.n. (ed.). Shanghai, China: Electron Device Society, p. 469-471 3 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Silicon-on-glass technology for RF and microwave device fabrication

Nanver, LK., Schellevis, H., Scholtes, TLM., La Spina, L., Lorito, G., Sarubbi, F., Gonda, V., Popadi¿, M., Buisman, K., de Vreede, LCN., Huang, C., Milosavljevic, S. & Goudena, EJG., 2006, 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings. s.n. (ed.). Shanghai, China: IEEE, p. 162-165 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Uniformity of Chemical Vapor Deposited Boron-Silicide Layers on Silicon

Sarubbi, F., Nanver, LK. & Scholtes, TLM., 2006, Proceedings of 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. s.n. (ed.). Veldhoven, The Netherlands: s.l., p. 479-482 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Versatile n-type profile engineering by controlling arsenic surface segregation in silicon RPCVD

Popadic, M., Sarubbi, F., Scholtes, TLM. & Nanver, LK., 2006, ECS Transactions. s.n (ed.). Ouro Preto, Brazil: Electrochemical Society, p. 393-399 7 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
2005

Distortion-free varactor diode topologies for RF adaptivity

Buisman, K., de Vreede, LCN., Larson, LE., Spirito, M., Akhnoukh, AB., Scholtes, TLM. & Nanver, LK., 2005, Proceedings IEEE MTT-S International Microwave Symposium Digest. Choudhury, D. (ed.). Piscataway: IEEE Society, p. 157-160 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

61 Citations (Scopus)

High-performance varactor diodes integrated in a silicon-on-glass technology

Buisman, K., Nanver, LK., Scholtes, TLM., Schellevis, H. & de Vreede, LCN., 2005, Proceedings of the 35th European solid-state device research conference (ESSDERC). Ghibaudo, G., Skotnicki, T., Cristoloveanu, S. & Brillouet, M. (eds.). Piscataway: IEEE Society, p. 117-120 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

13 Citations (Scopus)

Near-ideal implanted shallow-junction diode formation by excimer laser annealing

Gonda, V., Bourtsev, A., Scholtes, TLM. & Nanver, LK., 2005, Proceedings of the 13th IEEE International Conference on Advanced Thermal Processing of Semiconductors. s.n. (ed.). Piscataway: IEEE Society, p. 93-100 8 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

11 Citations (Scopus)

The effect of the contact window edges on the perimeter currents of shallow junction diodes

Gonda, V., Scholtes, TLM. & Nanver, LK., 2005, Proceedings of the STW annual workshop on semiconductor advances for future electronics and sensors (SAFE 2005). s.n. (ed.). Utrecht, The Netherlands: Dutch Technology Foundation, p. 88-91 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2004

Surface roughness of contact windows for shallow junction formation

Gonda, V., Burtsev, A., Scholtes, TLM. & Nanver, LK., 2004, SAFE & ProRISC 2004; Proceedings of semiconductor advances for future electronics. Utrecht: STW Technology Foundation, p. 639-642 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2003

Electrical characterization of silicon diodes formed by laser annealing of implanted dopants

Nanver, LK., Slabbekoorn, JHCM., Burtsev, A., Scholtes, TLM., Surdeanu, R., Simonetti, F., Kalhert, HJ. & Slotboom, JW., 2003, Advanced short-time thermal processing for Si-based CMOS devices. Roozeboom, F., Gusev, E., Chen, LJ., Ozturk, MC., Kwong, DL. & Timans, PJ. (eds.). Pennington, USA: The Electrochemical Society, p. 119-130 12 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

2002

CV doping profiling of boron out-diffusion using an abrupt and highly doped arsenic buried epilayer

Ortiz, C., Nanver, LK., van Noort, WD., Scholtes, TLM. & Slotboom, JW., 2002, ICMTS 2002 IEEE 2002 International Conference on Microelectronic Test Structures. Piscataway, NJ. USA: IEEE Society, p. 83-88 6 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)

CV-doping profiling of shallow junctions with an abrupt and highly doped arsenic buried epilayer

Ortiz, C., Nanver, LK., van Noort, WD., Scholtes, TLM. & Slotboom, JW., 2002, SAFE 2002 Proceedings of the 5th Semiconductor Advances for Future Electronics Workshop. Utrecht: STW Technology Foundation, p. 75-80 6 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

240 Citations (Scopus)

Direct spray coating of photoresist - a new method for patterning 3-D structures

Pham, PN., Scholtes, TLM., Klerks, R., Boellaard, E., Sarro, PM. & Burghartz, JN., 2002, Proceedings Eurosensors XVI. Saneistr, J. & Ripka, P. (eds.). Prague: Czech Technical University, p. 182-185 4 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2001

Direct spray coating of photoresist for MEMS applications

Pham, PN., Scholtes, TLM., Klerk, R., Wieder, B., Sarro, PM. & Burghartz, JN., 2001, Proceedings of SPIE. Vol. 4557. J-M Karam & J Yasaitis (eds.). Bellingham: International Society for Optical Engineering, p. 312-319 8 p.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

16 Citations (Scopus)