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2022
Electron-beam patterned calibration structures for structured illumination microscopy
Hari, S., Slotman, J. A., Vos, Y., Floris, C., van Cappellen, W. A., Hagen, C. W., Stallinga, S., Houtsmuller, A. B. & Hoogenboom, J. P., 2022, In: Scientific Reports. 12, 1, p. 10 20185.
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