DFT'21 Outstanding Student Paper

  • Balakrishnan, A. (Recipient), Cardoso Medeiros, G. (Recipient), Cem Gursoy, C. (Recipient), Hamdioui, S. (Recipient), Jenihhin, M. (Recipient) & Alexandrescu, D. (Recipient)

Prize: Prize (including medals and awards)


Outstanding Student Paper from the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Degree of recognitionInternational
Granting OrganisationsIEEE Test Technology Technical Council (TTTC)