DFT'21 Outstanding Student Paper

  • Aneesh Balakrishnan (Recipient), Cardoso Medeiros, G. (Recipient), Cemil Cem Gursoy (Recipient), Hamdioui, S. (Recipient), M. Jenihhin (Recipient) & Dan Alexandrescu (Recipient)

Prize: Prize (including medals and awards)

Description

Outstanding Student Paper from the 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Degree of recognitionInternational
Granting OrganisationsIEEE Test Technology Technical Council (TTTC)

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