Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors

  • Hou, R. (Recipient)

Prize: Prize (including medals and awards)

Awarded at event

Event titleStudent paper finalist at the International microwave symposium, IEEE MTT-S IMS 2015
LocationPhoenix, AZ, USA
Period17 May 2015 → 22 May 2015