25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: Feature introduction

Peter Kner; Suliana Manley; Yoav Shechtman; Sjoerd Stallinga

doi:10.1364/BOE.391490

25^th Anniversary of STED Microscopy and the 20^th Anniversary of SIM: Feature introduction

Peter Kner^*, Suliana Manley, Yoav Shechtman, Sjoerd Stallinga

^*Corresponding author for this work

ImPhys/Imaging Physics

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Abstract

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.

Original language	English
Pages (from-to)	1707-1711
Journal	Biomedical Optics Express
Volume	11
Issue number	3
DOIs	https://doi.org/10.1364/BOE.391490
Publication status	Published - 2020

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title = "25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: Feature introduction",

abstract = "This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.",

author = "Peter Kner and Suliana Manley and Yoav Shechtman and Sjoerd Stallinga",

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PY - 2020

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AB - This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.

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M3 - Article

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JO - Biomedical Optics Express

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25^th Anniversary of STED Microscopy and the 20^th Anniversary of SIM: Feature introduction

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