25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: Feature introduction

Peter Kner, Suliana Manley, Yoav Shechtman, Sjoerd Stallinga

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.

Original languageEnglish
Pages (from-to)1707-1711
JournalBiomedical Optics Express
Volume11
Issue number3
DOIs
Publication statusPublished - 2020

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