28 GHz Quadrature Frequency Generation Exploiting Injection-Locked Harmonic Extractors for 5G Communications

Zhong Gao, Yizhe Hu, Teerachot Siriburanon, Robert Bogdan Staszewski

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

13 Downloads (Pure)

Abstract

This paper proposes a mm-wave quadrature frequency generator using injection-locked harmonic extractors (HEs) incorporated with quadrature class-F oscillators. While maintaining high output levels at 28 GHz, the utilization of injection locking technique improves the effective quality ($Q$)-factor and helps to achieve a fundamental harmonic suppression of 60 dB. This results in an FoM of the entire frequency generation system reaching -184 dB. The consideration of quadrature phase mismatch induced by electromagnetic coupling between quadrature buffers is also discussed.

Original languageEnglish
Title of host publication17th IEEE International New Circuits and Systems Conference, NEWCAS 2019
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages4
ISBN (Electronic)9781728110318
DOIs
Publication statusPublished - 2019
Event17th IEEE International New Circuits and Systems Conference, NEWCAS 2019 - Munich, Germany
Duration: 23 Jun 201926 Jun 2019

Conference

Conference17th IEEE International New Circuits and Systems Conference, NEWCAS 2019
CountryGermany
CityMunich
Period23/06/1926/06/19

Keywords

  • harmonic extraction (HE)
  • Injection locking (IL)
  • quadrature (I/Q) frequency generation

Fingerprint Dive into the research topics of '28 GHz Quadrature Frequency Generation Exploiting Injection-Locked Harmonic Extractors for 5G Communications'. Together they form a unique fingerprint.

  • Cite this

    Gao, Z., Hu, Y., Siriburanon, T., & Staszewski, R. B. (2019). 28 GHz Quadrature Frequency Generation Exploiting Injection-Locked Harmonic Extractors for 5G Communications. In 17th IEEE International New Circuits and Systems Conference, NEWCAS 2019 [8961293] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/NEWCAS44328.2019.8961293