@inproceedings{3ff3da7236964987a52dd13440fb6e99,
title = "2D simulation of hot-carrier-induced degradation and reliability analysis for single grain Si TFTs",
keywords = "conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",
author = "J Tan and A Baiano and R Ishihara and CIM Beenakker",
year = "2008",
language = "Undefined/Unknown",
isbn = "978-90-73461-56-7",
publisher = "STW",
pages = "600--603",
editor = "s.n.",
booktitle = "The annual workshop on semiconductor advances for future electronics and sensors",
note = "SAFE 2008, Veldhoven, the Netherlands ; Conference date: 27-11-2008 Through 28-11-2008",
}