Error analysis and reliability of zero-order Lamb mode inversion for waveguide characterization

A. Sabbadini*, J. Massaad, P. L.M.J. van Neer, N. de Jong, M. D. Verweij

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)
49 Downloads (Pure)

Abstract

In recent years, several fitting techniques have been presented to reconstruct the parameters of a plate from its Lamb wave dispersion curves. Published studies show that these techniques can yield high accuracy results and have the potential of reconstructing several parameters at once. The precision with which parameters can be reconstructed by inverting Lamb wave dispersion curves, however, remains an open question of fundamental importance to many applications. In this work, we introduce a method of analyzing dispersion curves that yields quantitative information on the precision with which the parameters can be extracted. In our method, rather than employing error minimization algorithms, we compare a target dispersion curve to a database of theoretical ones that covers a given parameter space. By calculating a measure of dissimilarity (error) for every point in the parameter space, we reconstruct the distribution of the error in that space, beside the location of its minimum. We then introduce dimensionless quantities that describe the distribution of this error, thus yielding information about the spread of similar curves in the parameter space. We demonstrate our approach by considering both idealized and realistic scenarios, analyzing the dispersion curves obtained numerically for a plate and experimentally for a pipe. Our results show that the precision with which each parameter is reconstructed depends on the mode used, as well as the frequency range in which it is considered.

Original languageEnglish
Article number106703
Number of pages10
JournalUltrasonics
Volume123
DOIs
Publication statusPublished - 2022

Keywords

  • Lamb wave
  • Multi-parameter inversion
  • Non-destructive testing
  • Sensitivity

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