4D Tomography for neutron depth profiling applications

R. Neagu*, S. Golenev, L. Werner, C. Berner, R. Gilles, Z. Revay, L. Ziegele, J. Plomp, B. Märkisch, R. Gernhäuser

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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Abstract

High-rate Neutron Depth Profiling (NDP) is a very efficient and precise probe for studying the evolution of lithium concentration in thin-layer structures, e.g., battery electrodes. NDP is typically limited to a one-dimensional depth analysis summed over the profile area covered by the neutron beam. We developed a detector system based on double-sided silicon strip detectors (DSSSD) with extremely thin and homogeneous entrance windows to provide a new quality of NDP measurements in 3+1 dimensions for the N4DP instrument at the FRM II in Garching, Germany. Using the 6Li(n, α)3H reaction in an experiment conducted at the research reactor in Delft, we achieved a lateral position resolution down to ∼100μm and an energy resolution with FWHM≈10keV for the triton particles at energies of 2.7MeV. High-resolution 3D pictures with a contrast uncertainty <10% per pixel can be achieved faster than 1 picture per minute. This rate can be adjusted individually for each experiment by sacrificing granularity in the position measurement.

Original languageEnglish
Article number169543
Number of pages10
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume1065
DOIs
Publication statusPublished - 2024

Keywords

  • Double-sided silicon strip detector
  • FRM II
  • N4DP-instrument
  • Neutron depth profiling
  • RID
  • Self-triggering electronics

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