4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	2011 International Image Sensor Workshop - IISW
Editors	N Terashini, J Nakamura
Place of Publication	Hokkaido, Japan
Publisher	Image Sensors
Pages	228-231
Number of pages	4
Publication status	Published - 2011
Event	2011 IISW - Hokkkaido, Japan Duration: 8 Jun 2011 → 11 Jun 2011

Name
Publisher	Image Sensors

Conference	2011 IISW
Period	8/06/11 → 11/06/11

Cite this

@inproceedings{0e1c0b87a6ea4f558d0740733a223bb0,

title = "4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation",

author = "J Tan and B Buettgen and AJP Theuwissen",

year = "2011",

language = "English",

publisher = "Image Sensors",

pages = "228--231",

editor = "N Terashini and J Nakamura",

booktitle = "2011 International Image Sensor Workshop - IISW",

note = "2011 IISW ; Conference date: 08-06-2011 Through 11-06-2011",

}

TY - GEN

T1 - 4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation

AU - Tan, J

AU - Buettgen, B

AU - Theuwissen, AJP

PY - 2011

Y1 - 2011

M3 - Conference contribution

SP - 228

EP - 231

BT - 2011 International Image Sensor Workshop - IISW

A2 - Terashini, N

A2 - Nakamura, J

PB - Image Sensors

CY - Hokkaido, Japan

T2 - 2011 IISW

Y2 - 8 June 2011 through 11 June 2011

ER -