Determining the decomposition voltage of Cu(In1-xGax)Se2

Klaas Bakker; Joaquin Coll Matas; Johan Bosman; Nicolas Barreau; Arthur Weeber; Mirjam Theelen

doi:10.1109/PVSC48317.2022.9938940

Determining the decomposition voltage of Cu(In_1-xGa_x)Se₂

Klaas Bakker, Joaquin Coll Matas, Johan Bosman, Nicolas Barreau, Arthur Weeber, Mirjam Theelen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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Abstract

Partial shading of CIGS modules can lead to permanent damage of the module in the shaded area. This is caused by harmful reverse bias voltages in the shaded area which lead to reverse bias induced defects, also known as wormlike defects. A lot is already known about the origin and propagation of wormlike defects. However, the fundamental question; why is CIGS so sensitive to reverse bias damage? has not yet been answered. In this study we show that CIGS semiconductor material in the presence of an electric field will spontaneously decompose.

Original language	English
Title of host publication	2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	381-383
Number of pages	3
ISBN (Electronic)	9781728161174
DOIs	https://doi.org/10.1109/PVSC48317.2022.9938940
Publication status	Published - 2022
Event	49th IEEE Photovoltaics Specialists Conference, PVSC 2022 - Philadelphia, United States Duration: 5 Jun 2022 → 10 Jun 2022

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
Volume	2022-June
ISSN (Print)	0160-8371

Conference

Conference	49th IEEE Photovoltaics Specialists Conference, PVSC 2022
Country/Territory	United States
City	Philadelphia
Period	5/06/22 → 10/06/22

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

CIGS
decomposition
partial shading
reliability
reverse bias

Access to Document

10.1109/PVSC48317.2022.9938940

Determining_the_decomposition_voltage_of_CuIn1-xGaxSe2Final published version, 494 KB

Cite this

Bakker, K., Matas, J. C., Bosman, J., Barreau, N., Weeber, A., & Theelen, M. (2022). Determining the decomposition voltage of Cu(In_1-xGa_x)Se₂. In 2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022 (pp. 381-383). (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2022-June). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PVSC48317.2022.9938940

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abstract = "Partial shading of CIGS modules can lead to permanent damage of the module in the shaded area. This is caused by harmful reverse bias voltages in the shaded area which lead to reverse bias induced defects, also known as wormlike defects. A lot is already known about the origin and propagation of wormlike defects. However, the fundamental question; why is CIGS so sensitive to reverse bias damage? has not yet been answered. In this study we show that CIGS semiconductor material in the presence of an electric field will spontaneously decompose. ",

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Bakker, K, Matas, JC, Bosman, J, Barreau, N, Weeber, A & Theelen, M 2022, Determining the decomposition voltage of Cu(In_1-xGa_x)Se₂. in 2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022. Conference Record of the IEEE Photovoltaic Specialists Conference, vol. 2022-June, Institute of Electrical and Electronics Engineers (IEEE), pp. 381-383, 49th IEEE Photovoltaics Specialists Conference, PVSC 2022, Philadelphia, United States, 5/06/22. https://doi.org/10.1109/PVSC48317.2022.9938940

Determining the decomposition voltage of Cu(In_1-xGa_x)Se₂. / Bakker, Klaas; Matas, Joaquin Coll; Bosman, Johan et al.
2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022. Institute of Electrical and Electronics Engineers (IEEE), 2022. p. 381-383 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2022-June).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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