TY - JOUR
T1 - 8-bit Dynamic Element Matching based Feedback Controller Applied to an Instrumentation Amplifier
AU - Calinescu, Alex
AU - Enachescu, Marius
AU - Antonescu, Alexandru
AU - Cotofana, Sorin
PY - 2024
Y1 - 2024
N2 - The instrumentation amplifier, which incorporates Dynamic Element Matching (DEM) and a resistive network, utilizes a digital controller to reduce gain error by means of averaging. This paper assesses the feasibility of combining, within a general-purpose microcontroller, the appealing DEM, i.e., very accurate resistive ratios ranging between 1 and 15, with the associated versatile and scalable interrupt-aware digital controller. Given a mixedsignal system, a hybrid evaluation environment has been developed to perform relevant testbenches for assessing the systems performance, i.e., DEM controller, muxes, OpAmps, with respect to relevant metrics for integrated digital and mixed-signal circuits, i.e., energy, delay, footprint, precision. When implementing our design in a commercial 180nm technology, the gain precision of a typical amplifier is improved by more than 1800 times, with the error converging to as low as 10s of ppm, for Gaussian mismatch distribution between-1% and 1% with the cost of DEM digital circuitry which adds about 30000 µm2 of chip area and will consume 194 µA.
AB - The instrumentation amplifier, which incorporates Dynamic Element Matching (DEM) and a resistive network, utilizes a digital controller to reduce gain error by means of averaging. This paper assesses the feasibility of combining, within a general-purpose microcontroller, the appealing DEM, i.e., very accurate resistive ratios ranging between 1 and 15, with the associated versatile and scalable interrupt-aware digital controller. Given a mixedsignal system, a hybrid evaluation environment has been developed to perform relevant testbenches for assessing the systems performance, i.e., DEM controller, muxes, OpAmps, with respect to relevant metrics for integrated digital and mixed-signal circuits, i.e., energy, delay, footprint, precision. When implementing our design in a commercial 180nm technology, the gain precision of a typical amplifier is improved by more than 1800 times, with the error converging to as low as 10s of ppm, for Gaussian mismatch distribution between-1% and 1% with the cost of DEM digital circuitry which adds about 30000 µm2 of chip area and will consume 194 µA.
KW - digital controller
KW - Dynamic Element Matching
KW - gain error
KW - instrumentation amplifier
KW - mismatch
UR - http://www.scopus.com/inward/record.url?scp=85203062332&partnerID=8YFLogxK
U2 - 10.59277/ROMJIST.2024.2.08
DO - 10.59277/ROMJIST.2024.2.08
M3 - Article
AN - SCOPUS:85203062332
SN - 1453-8245
VL - 27
SP - 217
EP - 228
JO - Romanian Journal of Information Science and Technology
JF - Romanian Journal of Information Science and Technology
IS - 2
ER -