A ±0.4°C (3¿) -70 to 200°C time-domain temperature sensor based on heat diffusion in Si and SiO2

CPL van Vroonhoven, D d'Aquino, KAA Makinwa

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

9 Citations (Scopus)
Original languageEnglish
Title of host publicationDigest of Technical Papers 2012 IEEE International Solid-state Circuits Conference
EditorsL Fujino
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages204-206
Number of pages3
ISBN (Print)978-1-4673-0377-4
DOIs
Publication statusPublished - 2012
EventISSCC 2012, San Francisco, CA, USA - Piscataway, NJ, USA
Duration: 19 Feb 201223 Feb 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceISSCC 2012, San Francisco, CA, USA
Period19/02/1223/02/12

Bibliographical note

Harvest
Article number: 6176976

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