Original language | English |
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Pages (from-to) | 2406-2418 |
Number of pages | 13 |
Journal | IEEE Journal of Solid State Circuits |
Volume | 50 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2015 |
A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography
JM Pavia, M Scandiuzzo, S Lindner, M Wolf, E Charbon
Research output: Contribution to journal › Article › Scientific › peer-review
52
Citations
(Scopus)