A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography

JM Pavia; M Scandiuzzo; S Lindner; M Wolf; E Charbon

doi:10.1109/JSSC.2015.2467170

A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography

JM Pavia, M Scandiuzzo, S Lindner, M Wolf, E Charbon

Circuits and Systems

Research output: Contribution to journal › Article › Scientific › peer-review

52 Citations (Scopus)

Original language	English
Pages (from-to)	2406-2418
Number of pages	13
Journal	IEEE Journal of Solid State Circuits
Volume	50
Issue number	10
DOIs	https://doi.org/10.1109/JSSC.2015.2467170
Publication status	Published - 2015

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10.1109/JSSC.2015.2467170

Cite this

@article{04dcfdf749054877bbfd8fca919929b8,

title = "A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography",

author = "JM Pavia and M Scandiuzzo and S Lindner and M Wolf and E Charbon",

note = "Harvest Date of publication 10-9-2015",

year = "2015",

doi = "10.1109/JSSC.2015.2467170",

language = "English",

volume = "50",

pages = "2406--2418",

journal = "IEEE Journal of Solid State Circuits",

issn = "0018-9200",

publisher = "IEEE",

number = "10",

}

A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography. / Pavia, JM; Scandiuzzo, M; Lindner, S; Wolf, M; Charbon, E.

In: IEEE Journal of Solid State Circuits, Vol. 50, No. 10, 2015, p. 2406-2418.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography

AU - Pavia, JM

AU - Scandiuzzo, M

AU - Lindner, S

AU - Wolf, M

AU - Charbon, E

N1 - Harvest Date of publication 10-9-2015

PY - 2015

Y1 - 2015

U2 - 10.1109/JSSC.2015.2467170

DO - 10.1109/JSSC.2015.2467170

M3 - Article

VL - 50

SP - 2406

EP - 2418

JO - IEEE Journal of Solid State Circuits

JF - IEEE Journal of Solid State Circuits

SN - 0018-9200

IS - 10

ER -